Hawren Fang

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Inspection of reticles using machine learning
- Patent number 12,094,101
- Issue date Sep 17, 2024
- KLA-Tencor Corporation
- Hawren Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer inspection using difference images
- Patent number 11,270,430
- Issue date Mar 8, 2022
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection of reticles using machine learning
- Patent number 11,257,207
- Issue date Feb 22, 2022
- KLA-Tencor Corporation
- Hawren Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Critical dimension uniformity enhancement techniques and apparatus
- Patent number 10,074,036
- Issue date Sep 11, 2018
- KLA-Tencor Corporation
- Yanwei Liu
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION OF RETICLES USING MACHINE LEARNING
- Publication number 20220084179
- Publication date Mar 17, 2022
- KLA-Tencor Corporation
- Hawren Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION OF RETICLES USING MACHINE LEARNING
- Publication number 20190206041
- Publication date Jul 4, 2019
- KLA-Tencor Corporation
- Hawren Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER INSPECTION USING DIFFERENCE IMAGES
- Publication number 20180342051
- Publication date Nov 29, 2018
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CRITICAL DIMENSION UNIFORMITY ENHANCEMENT TECHNIQUES AND APPARATUS
- Publication number 20160110858
- Publication date Apr 21, 2016
- KLA-Tencor Corporation
- Yanwei Liu
- G06 - COMPUTING CALCULATING COUNTING