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Hayato Kimura
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Semiconductor device, angle value correction circuit and method the...
Patent number
10,969,400
Issue date
Apr 6, 2021
Renesas Electronics Corporation
Yoshitaka Shibuya
G01 - MEASURING TESTING
Information
Patent Grant
Photosensor device and disk inspection apparatus using it
Patent number
7,057,157
Issue date
Jun 6, 2006
Kirin Techno-System Corporation
Hayato Kimura
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
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Patent Application
SEMICONDUCTOR DEVICE, ANGLE VALUE CORRECTION CIRCUIT AND METHOD THE...
Publication number
20190137535
Publication date
May 9, 2019
RENESAS ELECTRONICS CORPORATION
Yoshitaka SHIBUYA
G01 - MEASURING TESTING
Information
Patent Application
Photosensor device and disk inspection apparatus using it
Publication number
20020079434
Publication date
Jun 27, 2002
TB Optical Co., Ltd.
Hayato Kimura
G01 - MEASURING TESTING