Hazem Hajj

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Defect analysis
- Patent number 8,064,682
- Issue date Nov 22, 2011
- Intel Corporation
- Yazan A. Alqudah
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Defect analysis
- Publication number 20090003684
- Publication date Jan 1, 2009
- Yazan A. Alqudah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automated yield analysis system
- Publication number 20090006436
- Publication date Jan 1, 2009
- Yazan A. Alqudah
- G01 - MEASURING TESTING
Information Patent Application
Software architecture for engineering analysis framework for semico...
- Publication number 20080082190
- Publication date Apr 3, 2008
- Sutirtha Bhattacharya
- G05 - CONTROLLING REGULATING