Hazem Hegazy

Person

Cairo, EG

People

Patents Grantslast 30 patents

Information Patent Grant
Edge center point-based characterization of semiconductor layout de...
- Patent number 12,299,951
- Issue date May 13, 2025
- SIEMENS INDUSTRY SOFTWARE INC.
- Hazem Hegazy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controllable pattern clustering for characterized semiconductor lay...
- Patent number 12,182,487
- Issue date Dec 31, 2024
- SIEMENS INDUSTRY SOFTWARE INC.
- Hazem Hegazy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor layout context around a point of interest
- Patent number 12,032,892
- Issue date Jul 9, 2024
- SIEMENS INDUSTRY SOFTWARE INC.
- David A. Abercrombie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shadow feature-based determination of capacitance values for integr...
- Patent number 11,687,695
- Issue date Jun 27, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Omar Elsewefy
- G01 - MEASURING TESTING
Information Patent Grant
Edge-based camera for characterizing semiconductor layout designs
- Patent number 11,017,147
- Issue date May 25, 2021
- SIEMENS INDUSTRY SOFTWARE INC.
- Hazem Hegazy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Offset fill
- Patent number 8,356,265
- Issue date Jan 15, 2013
- Fady Fouad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structures and method for interconnect impedance property extr...
- Patent number 7,340,703
- Issue date Mar 4, 2008
- Hazem Mahmoud Hegazy
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EDGE CENTER POINT-BASED CHARACTERIZATION OF SEMICONDUCTOR LAYOUT DE...
- Publication number 20240071038
- Publication date Feb 29, 2024
- Siemens Industry Software Inc.
- Hazem Hegazy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROLLABLE PATTERN CLUSTERING FOR CHARACTERIZED SEMICONDUCTOR LAY...
- Publication number 20230069262
- Publication date Mar 2, 2023
- Siemens Industry Software Inc.
- Hazem Hegazy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHADOW FEATURE-BASED DETERMINATION OF CAPACITANCE VALUES FOR INTEGR...
- Publication number 20220318479
- Publication date Oct 6, 2022
- Siemens Industry Software Inc.
- Omar Elsewefy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR LAYOUT CONTEXT AROUND A POINT OF INTEREST
- Publication number 20220309222
- Publication date Sep 29, 2022
- Siemens Industry Software Inc.
- David A. Abercrombie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Edge-Based Camera for Characterizing Semiconductor Layout Designs
- Publication number 20210064717
- Publication date Mar 4, 2021
- Mentor Graphics Corporation
- Hazem Hegazy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Substrate Noise Assessment Flow In Mixed-Signal And SOC Designs
- Publication number 20120131532
- Publication date May 24, 2012
- Hazem Hegazy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Offset Fill
- Publication number 20090013298
- Publication date Jan 8, 2009
- Fady Fouad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test structures and method for interconnect impedance property extr...
- Publication number 20060022678
- Publication date Feb 2, 2006
- Mentor Graphics Corporation
- Hazem Mahmoud Hegazy
- G01 - MEASURING TESTING

Hazem Hegazy

Person

Patents Grantslast 30 patents

Edge center point-based characterization of semiconductor layout de...

Controllable pattern clustering for characterized semiconductor lay...

Semiconductor layout context around a point of interest

Shadow feature-based determination of capacitance values for integr...

Edge-based camera for characterizing semiconductor layout designs

Offset fill

Test structures and method for interconnect impedance property extr...

Patents Applicationslast 30 patents

EDGE CENTER POINT-BASED CHARACTERIZATION OF SEMICONDUCTOR LAYOUT DE...

CONTROLLABLE PATTERN CLUSTERING FOR CHARACTERIZED SEMICONDUCTOR LAY...

SHADOW FEATURE-BASED DETERMINATION OF CAPACITANCE VALUES FOR INTEGR...

SEMICONDUCTOR LAYOUT CONTEXT AROUND A POINT OF INTEREST

Edge-Based Camera for Characterizing Semiconductor Layout Designs

Substrate Noise Assessment Flow In Mixed-Signal And SOC Designs

Offset Fill

Test structures and method for interconnect impedance property extr...