Hedser Van Brug

Person

Den Haag, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Interferometric gas sensor
- Patent number 12,209,958
- Issue date Jan 28, 2025
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hedser van Brug
- G01 - MEASURING TESTING
Information Patent Grant
Focal in-field pointing telescope system
- Patent number 11,774,734
- Issue date Oct 3, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Huibert Visser
- G02 - OPTICS
Information Patent Grant
Interferometer system and use thereof
- Patent number 11,143,498
- Issue date Oct 12, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Huibert Visser
- G01 - MEASURING TESTING
Information Patent Grant
Correction of curved projection of a spectrometer slit line
- Patent number 11,067,441
- Issue date Jul 20, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Huibert Visser
- G01 - MEASURING TESTING
Information Patent Grant
Spatially resolved aerosol detection
- Patent number 10,578,545
- Issue date Mar 3, 2020
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Hedser van Brug
- G01 - MEASURING TESTING
Information Patent Grant
High resolution broadband monolithic spectrometer and method
- Patent number 10,508,951
- Issue date Dec 17, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Borgert Kruizinga
- G01 - MEASURING TESTING
Information Patent Grant
Spatially resolved gas detection
- Patent number 10,473,526
- Issue date Nov 12, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Huibert Visser
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus, lithographic system provided with the inspect...
- Patent number 8,064,038
- Issue date Nov 22, 2011
- ASML Netherlands B.V.
- Egbert Anne Martijn Brouwer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Illumination of a patterning device based on interference for use i...
- Patent number 7,768,627
- Issue date Aug 3, 2010
- ASML Netherlands B.V.
- Huibert Visser
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of imaging radiation from an object on a detection device an...
- Patent number 7,697,128
- Issue date Apr 13, 2010
- ASML Netherlands B.V.
- Robert Snel
- G01 - MEASURING TESTING
Information Patent Grant
Lithographic apparatus and method
- Patent number 7,522,263
- Issue date Apr 21, 2009
- ASML Netherlands B.V.
- Hubert Adriaan Van Mierlo
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring contour variations
- Patent number 7,471,398
- Issue date Dec 30, 2008
- Nederlandse Organisatie voor Toegepast-Natuurwetenschappelijk Onderzoek TNO
- Ian Saunders
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for polishing a workpiece surface
- Patent number 7,121,922
- Issue date Oct 17, 2006
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk Onderzoek TNO
- Hedser van Brug
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
INTERFEROMETRIC GAS SENSOR
- Publication number 20230349824
- Publication date Nov 2, 2023
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hedser VAN BRUG
- G01 - MEASURING TESTING
Information Patent Application
A FOCAL IN-FIELD POINTING TELESCOPE SYSTEM
- Publication number 20210263292
- Publication date Aug 26, 2021
- Huibert VISSER
- G02 - OPTICS
Information Patent Application
CORRECTION OF CURVED PROJECTION OF A SPECTROMETER SLIT LINE
- Publication number 20190368926
- Publication date Dec 5, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Huibert VISSER
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM AND USE THEREOF
- Publication number 20190323821
- Publication date Oct 24, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Huibert VISSER
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION BROADBAND MONOLITHIC SPECTROMETER AND METHOD
- Publication number 20190017869
- Publication date Jan 17, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Borgert KRUIZINGA
- G01 - MEASURING TESTING
Information Patent Application
SPATIALLY RESOLVED GAS DETECTION
- Publication number 20180283949
- Publication date Oct 4, 2018
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Huibert Visser
- G01 - MEASURING TESTING
Information Patent Application
SPATIALLY RESOLVED AEROSOL DETECTION
- Publication number 20180284013
- Publication date Oct 4, 2018
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETEN SCHAPPELIJK ONDERZOEK TNO
- Hedser van Brug
- G01 - MEASURING TESTING
Information Patent Application
Illumination of a Patterning Device Based on Interference for Use i...
- Publication number 20080309906
- Publication date Dec 18, 2008
- ASML NETHERLANDS B.V.
- Huibert Visser
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Inspection apparatus, lithographic system provided with the inspect...
- Publication number 20070146695
- Publication date Jun 28, 2007
- ASML NETHERLANDS B.V.
- Egbert Anne Martijn Brouwer
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for manufacturing or working optical elements...
- Publication number 20060079157
- Publication date Apr 13, 2006
- Hedser Van Brug
- B24 - GRINDING POLISHING

Hedser Van Brug

Person

Patents Grantslast 30 patents

Interferometric gas sensor

Focal in-field pointing telescope system

Interferometer system and use thereof

Correction of curved projection of a spectrometer slit line

Spatially resolved aerosol detection

High resolution broadband monolithic spectrometer and method

Spatially resolved gas detection

Inspection apparatus, lithographic system provided with the inspect...

Illumination of a patterning device based on interference for use i...

Method of imaging radiation from an object on a detection device an...

Lithographic apparatus and method

Method for measuring contour variations

Method and apparatus for polishing a workpiece surface

Patents Applicationslast 30 patents

INTERFEROMETRIC GAS SENSOR

A FOCAL IN-FIELD POINTING TELESCOPE SYSTEM

CORRECTION OF CURVED PROJECTION OF A SPECTROMETER SLIT LINE

INTERFEROMETER SYSTEM AND USE THEREOF

HIGH RESOLUTION BROADBAND MONOLITHIC SPECTROMETER AND METHOD

SPATIALLY RESOLVED GAS DETECTION

SPATIALLY RESOLVED AEROSOL DETECTION

Illumination of a Patterning Device Based on Interference for Use i...

Inspection apparatus, lithographic system provided with the inspect...

Apparatus and method for manufacturing or working optical elements...