Hee-Won SUNWOO

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method for detecting defect of substrate
- Patent number 8,890,069
- Issue date Nov 18, 2014
- Samsung Electronics Co., Ltd.
- Jong-Cheon Sun
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETECTING DEFECT OF SUBSTRATE
- Publication number 20140306109
- Publication date Oct 16, 2014
- Samsung Electronics Co., Ltd.
- Jong-Cheon SUN
- G01 - MEASURING TESTING