Hee-Wook YOU

Person

Anyang-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting foreign substance on substrate
- Patent number 10,705,028
- Issue date Jul 7, 2020
- Koh Young Technology Inc.
- Hyun-Seok Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting foreign substance on substrate
- Patent number 10,060,859
- Issue date Aug 28, 2018
- Koh Young Technology Inc.
- Hyun-Seok Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting a substrate
- Patent number 9,885,669
- Issue date Feb 6, 2018
- Koh Young Technology Inc.
- Soo-Young Cho
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring measurement target
- Patent number 9,256,912
- Issue date Feb 9, 2016
- Koh Young Technology Inc.
- Joong-Ki Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Method of checking an inspection apparatus and method of establishi...
- Patent number 9,124,810
- Issue date Sep 1, 2015
- Koh Young Technology Inc.
- Hee-Wook You
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Three dimensional shape measurement apparatus and method
- Patent number 8,878,929
- Issue date Nov 4, 2014
- Koh Young Technology Inc.
- Ho Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring measurement target
- Patent number 8,644,590
- Issue date Feb 4, 2014
- Koh Young Technology Inc.
- Joong-Ki Jeong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF INSPECTING FOREIGN SUBSTANCE ON SUBSTRATE
- Publication number 20180328857
- Publication date Nov 15, 2018
- KOH YOUNG TECHNOLOGY INC.
- Hyun-Seok LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING FOREIGN SUBSTANCE ON SUBSTRATE
- Publication number 20160025649
- Publication date Jan 28, 2016
- KOH YOUNG TECHNOLOGY INC.
- Hyun-Seok LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INPSECTING A SUBSTRATE
- Publication number 20140009601
- Publication date Jan 9, 2014
- KOH YOUNG TECHNOLOGY INC.
- Soo-Young Cho
- G01 - MEASURING TESTING
Information Patent Application
THREE DIMENSIONAL SHAPE MEASUREMENT APPARATUS AND METHOD
- Publication number 20140010438
- Publication date Jan 9, 2014
- KOH YOUNG TECHNOLOGY INC.
- Ho KIM
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING MEASUREMENT TARGET
- Publication number 20130010102
- Publication date Jan 10, 2013
- KOH YOUNG TECHNOLOGY INC.
- Joong-Ki JEONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CHECKING AN INSPECTION APPARATUS AND METHOD OF ESTABLISHI...
- Publication number 20110254949
- Publication date Oct 20, 2011
- KOH YOUNG TECHNOLOGY INC.
- Hee-Wook You
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
THREE DIMENSIONAL SHAPE MEASUREMENT APPARATUS AND METHOD
- Publication number 20100302364
- Publication date Dec 2, 2010
- KOH YOUNG TECHNOLOGY INC.
- Ho KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MEASURING MEASUREMENT TARGET
- Publication number 20100290696
- Publication date Nov 18, 2010
- KOH YOUNG TECHNOLOGY INC.
- Joong-Ki JEONG
- G06 - COMPUTING CALCULATING COUNTING

Hee-Wook YOU

Person

Patents Grantslast 30 patents

Method of inspecting foreign substance on substrate

Method of inspecting foreign substance on substrate

Method of inspecting a substrate

Method of measuring measurement target

Method of checking an inspection apparatus and method of establishi...

Three dimensional shape measurement apparatus and method

Method of measuring measurement target

Patents Applicationslast 30 patents

METHOD OF INSPECTING FOREIGN SUBSTANCE ON SUBSTRATE

METHOD OF INSPECTING FOREIGN SUBSTANCE ON SUBSTRATE

METHOD OF INPSECTING A SUBSTRATE

THREE DIMENSIONAL SHAPE MEASUREMENT APPARATUS AND METHOD

METHOD OF MEASURING MEASUREMENT TARGET

METHOD OF CHECKING AN INSPECTION APPARATUS AND METHOD OF ESTABLISHI...

THREE DIMENSIONAL SHAPE MEASUREMENT APPARATUS AND METHOD

METHOD OF MEASURING MEASUREMENT TARGET