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last 30 patents
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Patent Application
SUBSTRATE INCLUDING TEST CIRCUIT AND SUBSTRATE TEST APPARATUS INCLU...
Publication number
20240194542
Publication date
Jun 13, 2024
Samsung Electronics Co., Ltd.
Junghyun PARK
G01 - MEASURING TESTING
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Patent Application
MOLDING APPARATUS FOR SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTU...
Publication number
20230343612
Publication date
Oct 26, 2023
Samsung Electronics Co., Ltd.
Minkyu Park
H01 - BASIC ELECTRIC ELEMENTS