Heejune Lee

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Hwaseong-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Digital droop detector, semiconductor device including the same, an...
- Patent number 12,057,844
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Sangheon Lee
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Built-in self-test circuits and semiconductor integrated circuits i...
- Patent number 11,867,757
- Issue date Jan 9, 2024
- Samsung Electronics Co., Ltd.
- Heejune Lee
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor integrated circuit and method of testing the same
- Patent number 11,698,410
- Issue date Jul 11, 2023
- Samsung Electronics Co., Ltd.
- Eunhye Oh
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
DIGITAL DROOP DETECTOR, SEMICONDUCTOR DEVICE INCLUDING THE SAME, AN...
- Publication number 20240072782
- Publication date Feb 29, 2024
- Samsung Electronics Co., Ltd.
- Sangheon LEE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF TESTING THE SAME
- Publication number 20220206062
- Publication date Jun 30, 2022
- Samsung Electronics Co., Ltd.
- Eunhye Oh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BUILT-IN SELF-TEST CIRCUITS AND SEMICONDUCTOR INTEGRATED CIRCUITS I...
- Publication number 20220187366
- Publication date Jun 16, 2022
- Samsung Electronics Co., Ltd.
- Heejune Lee
- H03 - BASIC ELECTRONIC CIRCUITRY