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Patents Grantslast 30 patents

Information Patent Grant
Method of generating a compensation matrix during a substrate inspe...
- Patent number 10,151,705
- Issue date Dec 11, 2018
- Koh Young Technology Inc.
- Seungwon Jung
- G01 - MEASURING TESTING
Information Patent Grant
Method of generating reference data for inspecting a circuit board
- Patent number 9,911,185
- Issue date Mar 6, 2018
- Koh Young Technology Inc.
- Seungwon Jung
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF GENERATING A COMPENSATION MATRIX DURING A SUBSTRATE INSPE...
- Publication number 20160223468
- Publication date Aug 4, 2016
- KOH YOUNG TECHNOLOGY INC.
- Seungwon JUNG
- G01 - MEASURING TESTING
Information Patent Application
A METHOD OF GENERATING REFERENCE DATA FOR INSPECTING A CIRCUIT BOARD
- Publication number 20160225129
- Publication date Aug 4, 2016
- KOH YOUNG TECHNOLOGY INC.
- Seungwon JUNG
- G01 - MEASURING TESTING