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Heidi M. Gordon
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Willingboro, NJ, US
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last 30 patents
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Patent Grant
Analytic method for use in electronic circuit assembly operations
Patent number
5,201,114
Issue date
Apr 13, 1993
AT&T Bell Laboratories
Iris Artaki
G01 - MEASURING TESTING
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Patent Grant
Nonlinear optical devices and methods
Patent number
5,155,620
Issue date
Oct 13, 1992
AT&T Bell Laboratories
Heidi M. Gordon
G02 - OPTICS