HEIICHIRO RYU

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KUMAMOTO, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,215,526
- Issue date Jan 4, 2022
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Katsuji Kimura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LIGHT EMITTING DEVICE AND RANGING SYSTEM
- Publication number 20230384424
- Publication date Nov 30, 2023
- Sony Semiconductor Solutions Corporation
- Kohei IMAYOSHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD, AND PROGRAM
- Publication number 20200292414
- Publication date Sep 17, 2020
- Sony Semiconductor Solutions Corporation
- KATSUJI KIMURA
- G01 - MEASURING TESTING