Heikki Johannes SIPILA

Person

ESPOO, FI

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray fluorescence analyzer and a method for performing an x-ray fl...
- Patent number 11,815,480
- Issue date Nov 14, 2023
- Outotec (Finland) Oy
- Tommi Koskinen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Ultraviolet flame detector
- Patent number 11,686,613
- Issue date Jun 27, 2023
- FENNO-AURUM OY
- Heikki Johannes Sipilä
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray fluorescence analyzer system and a method for performing X-ra...
- Patent number 11,680,913
- Issue date Jun 20, 2023
- Outotec (Finland) Oy
- Heikki Sipilä
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a multilayer radiation window and a multil...
- Patent number 11,469,086
- Issue date Oct 11, 2022
- AMETEK Finland Oy
- Jari Kostamo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray fluorescence analyzer, and a method for performing X-ray fluo...
- Patent number 11,360,036
- Issue date Jun 14, 2022
- Outotec (Finland) Oy
- Tommi Koskinen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray fluorescence analyzer with a plurality of measurement channel...
- Patent number 11,199,513
- Issue date Dec 14, 2021
- Outotec (Finland) Oy
- Tommi Koskinen
- G01 - MEASURING TESTING
Information Patent Grant
Gas drift detector
- Patent number 11,105,936
- Issue date Aug 31, 2021
- Heikki Sipila OY
- Heikki Johannes Sipila
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing radiation window and a radiation window
- Patent number 10,483,079
- Issue date Nov 19, 2019
- HS FOILS OY
- Pekka Torma
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Radiation window with good strength properties, and method for its...
- Patent number 9,697,922
- Issue date Jul 4, 2017
- HS FOILS OY
- Heikki Johannes Sipilä
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Reinforced radiation window, and method for manufacturing the same
- Patent number 9,640,358
- Issue date May 2, 2017
- HS FOILS OY
- Esa Kostamo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra thin radiation window and method for its manufacturing
- Patent number 9,607,723
- Issue date Mar 28, 2017
- HS FOILS OY
- Heikki Johannes Sipilä
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and arrangement for manufacturing a radiation window
- Patent number 9,564,252
- Issue date Feb 7, 2017
- HS FOILS OY
- Esa Kostamo
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for protecting a radiation window
- Patent number 9,182,362
- Issue date Nov 10, 2015
- Bruker AXS Handheld, Inc.
- Esko Juhani Kantonen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tube and X-ray fluorescence analyser utilizing selective exci...
- Patent number 9,070,530
- Issue date Jun 30, 2015
- Outotec Oyj
- Heikki Johannes Sipilä
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for patterning detector crystal using Q-switched laser
- Patent number 7,727,796
- Issue date Jun 1, 2010
- Oxford Instruments Analytical Oy
- Heikki Johannes Sipilä
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Gas tight radiation window, and a method for its manufacturing
- Patent number 7,660,393
- Issue date Feb 9, 2010
- Oxford Instruments Analytical Oy
- Heikki Johannes Sipilä
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective irradiation of small target area in X-ray fluorescent spe...
- Patent number 7,443,959
- Issue date Oct 28, 2008
- Oxford Instruments Analytical Oy
- Esko Juhani Kantonen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Measurement apparatus and method for determining the material compo...
- Patent number 7,233,643
- Issue date Jun 19, 2007
- Oxford Instruments Analytical Oy
- Heikki Johannes Sipilä
- G01 - MEASURING TESTING
Information Patent Grant
Drift-type detector with limited noise level
- Patent number 7,173,250
- Issue date Feb 6, 2007
- Oxford Instruments Analtyical Oy
- Erkki Sakari Kiuru
- G01 - MEASURING TESTING
Information Patent Grant
Measurement arrangement for X-ray fluoresence analysis
- Patent number 7,065,174
- Issue date Jun 20, 2006
- Oxford Instruments Analytical Oy
- Heikki Johannes Sipilä
- G01 - MEASURING TESTING
Information Patent Grant
Adapter and analyzer device for performing X-ray fluorescence analy...
- Patent number 7,020,238
- Issue date Mar 28, 2006
- Oxford Instruments Analytical Oy
- Esko Juhani Kantonen
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector, arrangement and method for measuring radioactiv...
- Patent number 6,967,329
- Issue date Nov 22, 2005
- Oxford Instruments Analytical Oy
- Heikki Johannes Sipilä
- G01 - MEASURING TESTING
Information Patent Grant
Imaging X-ray detector based on direct conversion
- Patent number 6,933,503
- Issue date Aug 23, 2005
- Oxford Instruments Analytical Oy
- Heikki Johannes Sipilä
- G01 - MEASURING TESTING
Information Patent Grant
Imaging system functioning on submillimeter waves
- Patent number 6,242,740
- Issue date Jun 5, 2001
- Metorex International Oy
- Arttu Luukanen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence measuring system making use of polarized excitat...
- Patent number 6,049,589
- Issue date Apr 11, 2000
- Metorex International Oy
- Heikki Sipila
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing sludgy materials
- Patent number 5,107,527
- Issue date Apr 21, 1992
- Outokumpu Oy
- Heikki J. Sipila
- G01 - MEASURING TESTING
Information Patent Grant
Method for activating a gas phase stabilizer installed within a gas...
- Patent number 4,778,346
- Issue date Oct 18, 1988
- Outokumpu Oy
- Marja-Leena Jarvinen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for arranging fragmentary particles into a row...
- Patent number 4,703,846
- Issue date Nov 3, 1987
- Outokumpu Oy
- Karl O. Salminen
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Method for taking the radiation background into account in the dete...
- Patent number 4,653,081
- Issue date Mar 24, 1987
- Outokumpu Oy
- Heikki J. Sipila
- G01 - MEASURING TESTING
Information Patent Grant
Way to prolong the service life of proportional counters
- Patent number 4,571,196
- Issue date Feb 18, 1986
- Outokumpu Oy
- Heikki J. Sipila
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
A UV SENSITIVE PHOTOCATHODE, A METHOD FOR PRODUCING A UV SENSITIVE...
- Publication number 20240234072
- Publication date Jul 11, 2024
- FENNO-AURUM OY
- Heikki Johannes Sipilä
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
A UV SENSITIVE PHOTOCATHODE, A METHOD FOR PRODUCING A UV SENSITIVE...
- Publication number 20240136139
- Publication date Apr 25, 2024
- FENNO-AURUM OY
- Heikki Johannes Sipilä
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
A SHIELD DEVICE FOR A RADIATION WINDOW, A RADIATION ARRANGEMENT COM...
- Publication number 20220399196
- Publication date Dec 15, 2022
- AMETEK Finland Oy
- Heikki Johannes SIPILÄ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRAVIOLET FLAME DETECTOR
- Publication number 20220128401
- Publication date Apr 28, 2022
- FENNO-AURUM OY
- Heikki Johannes SIPILÄ
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER SYSTEM AND A METHOD FOR PERFORMING X-RA...
- Publication number 20210325321
- Publication date Oct 21, 2021
- OUTOTEC (FINLAND) OY
- Heikki Sipilä
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER WITH A PLURALITY OF MEASUREMENT CHANNEL...
- Publication number 20210255122
- Publication date Aug 19, 2021
- OUTOTEC (FINLAND) OY
- Tommi Koskinen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER, AND A METHOD FOR PERFORMING X-RAY FLUO...
- Publication number 20210255123
- Publication date Aug 19, 2021
- OUTOTEC (FINLAND) OY
- Tommi Koskinen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER, AND A METHOD FOR PERFORMING X-RAY FLUO...
- Publication number 20210255121
- Publication date Aug 19, 2021
- OUTOTEC (FINLAND) OY
- Tommi Koskinen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Method for Manufacturing a Multilayer Radiation Window and a Multil...
- Publication number 20210233752
- Publication date Jul 29, 2021
- AMETEK Finland Oy
- Jari KOSTAMO
- B32 - LAYERED PRODUCTS
Information Patent Application
RADIATION WINDOW STRUCTURE AND A METHOD FOR MANUFACTURING THE RADIA...
- Publication number 20200299833
- Publication date Sep 24, 2020
- HS FOILS OY
- Heikki Johannes SIPILÄ
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
A GAS DRIFT DETECTOR
- Publication number 20200096653
- Publication date Mar 26, 2020
- HEIKKI SIPILA OY
- Heikki Johannes SIPILA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING RADIATION WINDOW AND A RADIATION WINDOW
- Publication number 20170154749
- Publication date Jun 1, 2017
- HS FOILS OY
- Pekka TORMA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SEMICONDUCTOR RADIATION DETECTOR WITH LOWERED BACKGROUND NOISE LEVEL
- Publication number 20160091613
- Publication date Mar 31, 2016
- FENNO-AURUM OY
- Heikki Johannes SIPILA
- G01 - MEASURING TESTING
Information Patent Application
REINFORCED RADIATION WINDOW, AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20150357150
- Publication date Dec 10, 2015
- HS FOILS OY
- Esa KOSTAMO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAVELENGTH DISPERSIVE CRYSTAL SPECTROMETER, A XRAY FLUORESCENCE DEV...
- Publication number 20150355116
- Publication date Dec 10, 2015
- FENNO-AURUM OY
- Heikki Johannes SIPILA
- G01 - MEASURING TESTING
Information Patent Application
Electron source and X-ray fluorescence analyser using an electron s...
- Publication number 20150060663
- Publication date Mar 5, 2015
- FENNO-AURUM OY
- Heikki Johannes Sipila
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND ARRANGEMENT FOR MANUFACTURING A RADIATION WINDOW
- Publication number 20150053640
- Publication date Feb 26, 2015
- HS FOILS OY
- Esa Kostamo
- B32 - LAYERED PRODUCTS
Information Patent Application
APPARATUS FOR PROTECTING A RADIATION WINDOW
- Publication number 20130279654
- Publication date Oct 24, 2013
- BRUKER AXS HANDHELD, INC.
- Esko Juhani Kantonen
- G01 - MEASURING TESTING
Information Patent Application
RADIATION WINDOW WITH GOOD STRENGTH PROPERTIES, AND METHOD FOR ITS...
- Publication number 20130089184
- Publication date Apr 11, 2013
- HS FOILS OY
- Heikki Johannes Sipilä
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
ULTRA THIN RADIATION WINDOW AND METHOD FOR ITS MANUFACTURING
- Publication number 20130077761
- Publication date Mar 28, 2013
- HS FOILS OY
- Heikki Johannes Sipilä
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY TUBE AND X-RAY FLUORESCENCE ANALYSER UTILIZING SELECTIVE EXCI...
- Publication number 20120321038
- Publication date Dec 20, 2012
- HEIKKI SIPILA OY
- Heikki Johannes SIPILÄ
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Gas tight radiation window, and a method for its manufacturing
- Publication number 20080317209
- Publication date Dec 25, 2008
- Oxford Instruments Analytical Oy.
- Heikki Johannes Sipila
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for patterning a detector crystal, and a semiconductor detec...
- Publication number 20080265358
- Publication date Oct 30, 2008
- Oxford Instruments Analytical Oy.
- Heikki Johannes Sipila
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Selective irradiation of small target area in X-Ray fluorescent spe...
- Publication number 20080095318
- Publication date Apr 24, 2008
- Esko Juhani Kantonen
- G01 - MEASURING TESTING
Information Patent Application
Collimator for x-ray spectrometry, and an x-ray spectrometric appar...
- Publication number 20070230664
- Publication date Oct 4, 2007
- Oxford Instruments Analytical Oy.
- Heikki Sipila
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Measurement apparatus and method for determining the material compo...
- Publication number 20060262900
- Publication date Nov 23, 2006
- Oxford Instruments Analytical Oy.
- Heikki Johannes Sipila
- G01 - MEASURING TESTING
Information Patent Application
Drift-type detector with limited noise level
- Publication number 20050285018
- Publication date Dec 29, 2005
- Erkki Sakari Kiuru
- G01 - MEASURING TESTING
Information Patent Application
Measurement arrangement for X-ray fluoresence analysis
- Publication number 20050129174
- Publication date Jun 16, 2005
- Heikki Sipila
- G01 - MEASURING TESTING
Information Patent Application
Imaging X-ray detector based on direct conversion
- Publication number 20040007671
- Publication date Jan 15, 2004
- Metorex International Oy
- Heikki Johannes Sipila
- G01 - MEASURING TESTING
Information Patent Application
Radiation detector, arrangement and method for measuring radioactiv...
- Publication number 20030138075
- Publication date Jul 24, 2003
- Metorex International Oy
- Heikki Johannes Sipila
- G01 - MEASURING TESTING

Heikki Johannes SIPILA

Person

Patents Grantslast 30 patents

X-ray fluorescence analyzer and a method for performing an x-ray fl...

Ultraviolet flame detector

X-ray fluorescence analyzer system and a method for performing X-ra...

Method for manufacturing a multilayer radiation window and a multil...

X-ray fluorescence analyzer, and a method for performing X-ray fluo...

X-ray fluorescence analyzer with a plurality of measurement channel...

Gas drift detector

Method for manufacturing radiation window and a radiation window

Radiation window with good strength properties, and method for its...

Reinforced radiation window, and method for manufacturing the same

Ultra thin radiation window and method for its manufacturing

Method and arrangement for manufacturing a radiation window

Apparatus for protecting a radiation window

X-ray tube and X-ray fluorescence analyser utilizing selective exci...

Method for patterning detector crystal using Q-switched laser

Gas tight radiation window, and a method for its manufacturing

Selective irradiation of small target area in X-ray fluorescent spe...

Measurement apparatus and method for determining the material compo...

Drift-type detector with limited noise level

Measurement arrangement for X-ray fluoresence analysis

Adapter and analyzer device for performing X-ray fluorescence analy...

Radiation detector, arrangement and method for measuring radioactiv...

Imaging X-ray detector based on direct conversion

Imaging system functioning on submillimeter waves

X-ray fluorescence measuring system making use of polarized excitat...

Method and apparatus for analyzing sludgy materials

Method for activating a gas phase stabilizer installed within a gas...

Method and apparatus for arranging fragmentary particles into a row...

Method for taking the radiation background into account in the dete...

Way to prolong the service life of proportional counters

Patents Applicationslast 30 patents

A UV SENSITIVE PHOTOCATHODE, A METHOD FOR PRODUCING A UV SENSITIVE...

A UV SENSITIVE PHOTOCATHODE, A METHOD FOR PRODUCING A UV SENSITIVE...

A SHIELD DEVICE FOR A RADIATION WINDOW, A RADIATION ARRANGEMENT COM...

ULTRAVIOLET FLAME DETECTOR

X-RAY FLUORESCENCE ANALYZER SYSTEM AND A METHOD FOR PERFORMING X-RA...

X-RAY FLUORESCENCE ANALYZER WITH A PLURALITY OF MEASUREMENT CHANNEL...

X-RAY FLUORESCENCE ANALYZER, AND A METHOD FOR PERFORMING X-RAY FLUO...

X-RAY FLUORESCENCE ANALYZER, AND A METHOD FOR PERFORMING X-RAY FLUO...

Method for Manufacturing a Multilayer Radiation Window and a Multil...

RADIATION WINDOW STRUCTURE AND A METHOD FOR MANUFACTURING THE RADIA...

A GAS DRIFT DETECTOR

METHOD FOR MANUFACTURING RADIATION WINDOW AND A RADIATION WINDOW

SEMICONDUCTOR RADIATION DETECTOR WITH LOWERED BACKGROUND NOISE LEVEL

REINFORCED RADIATION WINDOW, AND METHOD FOR MANUFACTURING THE SAME

WAVELENGTH DISPERSIVE CRYSTAL SPECTROMETER, A XRAY FLUORESCENCE DEV...

Electron source and X-ray fluorescence analyser using an electron s...

METHOD AND ARRANGEMENT FOR MANUFACTURING A RADIATION WINDOW

APPARATUS FOR PROTECTING A RADIATION WINDOW

RADIATION WINDOW WITH GOOD STRENGTH PROPERTIES, AND METHOD FOR ITS...

ULTRA THIN RADIATION WINDOW AND METHOD FOR ITS MANUFACTURING

X-RAY TUBE AND X-RAY FLUORESCENCE ANALYSER UTILIZING SELECTIVE EXCI...

Gas tight radiation window, and a method for its manufacturing

Method for patterning a detector crystal, and a semiconductor detec...

Selective irradiation of small target area in X-Ray fluorescent spe...

Collimator for x-ray spectrometry, and an x-ray spectrometric appar...

Measurement apparatus and method for determining the material compo...

Drift-type detector with limited noise level

Measurement arrangement for X-ray fluoresence analysis

Imaging X-ray detector based on direct conversion

Radiation detector, arrangement and method for measuring radioactiv...