HEIKO AHRENS

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MUNICH, DE

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit device and method of performing self-testing wit...
- Patent number 9,529,047
- Issue date Dec 27, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Markus Regner
- G01 - MEASURING TESTING
Information Patent Grant
Circuit arrangement for logic built-in self-test of a semiconductor...
- Patent number 9,448,283
- Issue date Sep 20, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Heiko Ahrens
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit device and method therefor
- Patent number 9,435,862
- Issue date Sep 6, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Vladimir Litovchenko
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing self-testing within an IC device
- Patent number 9,091,726
- Issue date Jul 28, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Markus Regner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT DEVICE AND METHOD OF PERFORMING SELF-TESTING WIT...
- Publication number 20160061890
- Publication date Mar 3, 2016
- FREESCALE SEMICONDUCTOR, INC.
- MARKUS REGNER
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DEVICE AND METHOD THEREFOR
- Publication number 20160011259
- Publication date Jan 14, 2016
- FREESCALE SEMICONDUCTOR, INC.
- VLADIMIR LITOVCHENKO
- G01 - MEASURING TESTING
Information Patent Application
A CIRCUIT ARRANGEMENT FOR LOGIC BUILT-IN SELF-TEST OF A SEMICONDUCT...
- Publication number 20150219717
- Publication date Aug 6, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Heiko Ahrens
- G01 - MEASURING TESTING