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Neubiberg, DE
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Patents Grants
last 30 patents
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Patent Grant
Integrated circuit, test assembly and method for testing an integra...
Patent number
11,874,325
Issue date
Jan 16, 2024
Infineon Technologies AG
Tobias Kilian
G01 - MEASURING TESTING
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Patent Grant
Integrated circuit with self-test circuit, method for operating an...
Patent number
11,619,668
Issue date
Apr 4, 2023
Infineon Technologies AG
Daniel Tille
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
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Patent Application
INTEGRATED CIRCUIT, TEST ASSEMBLY AND METHOD FOR TESTING AN INTEGRA...
Publication number
20230079599
Publication date
Mar 16, 2023
INFINEON TECHNOLOGIES AG
Tobias Kilian
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT WITH SELF-TEST CIRCUIT, METHOD FOR OPERATING AN...
Publication number
20210263099
Publication date
Aug 26, 2021
INFINEON TECHNOLOGIES AG
Daniel Tille
G01 - MEASURING TESTING