Heiko Haschke

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Rostock, DE

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Patents Grantslast 30 patents

Information Patent Grant
Probe mounting device for a scanning probe microscope
- Patent number 7,114,405
- Issue date Oct 3, 2006
- JPK Instruments AG
- Olaf Sünwoldt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Device for fixing a measuring probe for a raster scanning probe mic...
- Publication number 20050017150
- Publication date Jan 27, 2005
- Olaf Sunwoldt
- G01 - MEASURING TESTING