Heiko Stegmann

Person

Dresden, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam system and method
- Patent number 10,854,421
- Issue date Dec 1, 2020
- Carl Zeiss Microscopy GmbH
- Daniela Donhauser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for processing an object
- Patent number 10,796,881
- Issue date Oct 6, 2020
- Carl Zeiss Microscopy GmbH
- Heiko Stegmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for the preparation of microscopy samples by...
- Patent number 9,816,946
- Issue date Nov 14, 2017
- Carl Zeiss Microscopy GmbH
- Heiko Stegmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES VIA BACKSIDE TH...
- Publication number 20240347312
- Publication date Oct 17, 2024
- CARL ZEISS MICROSCOPY GMBH
- Heiko Stegmann
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHODS FOR CREATING A TRENCH IN A SAMPLE, AND COMPUTER PROGRAM PRO...
- Publication number 20240192124
- Publication date Jun 13, 2024
- Heiko Stegmann
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PRODUCING A SAMPLE ON AN OBJECT, COMPUTER PROGRAM PRODUC...
- Publication number 20230260744
- Publication date Aug 17, 2023
- CARL ZEISS MICROSCOPY GMBH
- Heiko Stegmann
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER SYSTEM WITH FREELY SETTABLE INCLINATION ANGLES
- Publication number 20230003988
- Publication date Jan 5, 2023
- CARL ZEISS MICROSCOPY GMBH
- Heiko Stegmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PROCESSING AN OBJECT
- Publication number 20200066483
- Publication date Feb 27, 2020
- CARL ZEISS MICROSCOPY GMBH
- Heiko Stegmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD
- Publication number 20190304743
- Publication date Oct 3, 2019
- CARL ZEISS MICROSCOPY GMBH
- Daniela Donhauser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SETTING AN OPERATING PARAMETER OF A PARTICLE BEAM DEVICE...
- Publication number 20130234011
- Publication date Sep 12, 2013
- Harald Niebel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Apparatus for the Preparation of Microscopy Samples by...
- Publication number 20130213945
- Publication date Aug 22, 2013
- CARL ZEISS MICROSCOPY GMBH
- Heiko Stegmann
- G01 - MEASURING TESTING
Information Patent Application
Method for setting an operating parameter of a particle beam device...
- Publication number 20100230584
- Publication date Sep 16, 2010
- Harald Niebel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for objective and accurate thickness measurement of thin fil...
- Publication number 20030222215
- Publication date Dec 4, 2003
- Quentin de Robillard
- G01 - MEASURING TESTING

Heiko Stegmann

Person

Patents Grantslast 30 patents

Charged particle beam system and method

Method for processing an object

Methods and apparatus for the preparation of microscopy samples by...

Patents Applicationslast 30 patents

DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES VIA BACKSIDE TH...

METHODS FOR CREATING A TRENCH IN A SAMPLE, AND COMPUTER PROGRAM PRO...

METHOD FOR PRODUCING A SAMPLE ON AN OBJECT, COMPUTER PROGRAM PRODUC...

SAMPLE HOLDER SYSTEM WITH FREELY SETTABLE INCLINATION ANGLES

METHOD FOR PROCESSING AN OBJECT

CHARGED PARTICLE BEAM SYSTEM AND METHOD

METHOD FOR SETTING AN OPERATING PARAMETER OF A PARTICLE BEAM DEVICE...

Methods and Apparatus for the Preparation of Microscopy Samples by...

Method for setting an operating parameter of a particle beam device...

Method for objective and accurate thickness measurement of thin fil...