Heinz Abplanalp

Person

  • Hombrechtikon, CH

Patents Grantslast 30 patents

  • Information Patent Grant

    Photometric analysis equipment

    • Patent number 4,931,402
    • Issue date Jun 5, 1990
    • Tecan AG Analytische Instrumente
    • Heinz Abplanalp
    • G01 - MEASURING TESTING