Heinz Loreck

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Tempe, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for monitoring an accelerometer
- Patent number 9,297,826
- Issue date Mar 29, 2016
- Freescale Semiconductor Inc.
- Deyou Fang
- G01 - MEASURING TESTING
Information Patent Grant
Device structures for in-plane and out-of-plane sensing micro-elect...
- Patent number 8,461,656
- Issue date Jun 11, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Woo Tae Park
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR MONITORING AN ACCELEROMETER
- Publication number 20140250971
- Publication date Sep 11, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Deyou FANG
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR MAKING IN-PLANE AND OUT-OF-PLANE SENSING MICRO-ELECTRO-...
- Publication number 20120001277
- Publication date Jan 5, 2012
- Woo Tae Park
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Method of Fabricating High Aspect Ratio Transducer Using Metal Comp...
- Publication number 20100193884
- Publication date Aug 5, 2010
- Woo Tae Park
- B81 - MICRO-STRUCTURAL TECHNOLOGY