Heinz Tovar

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Siegsdorf, DE

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Patents Grantslast 30 patents

Information Patent Grant
Position-measuring device
- Patent number 8,820,623
- Issue date Sep 2, 2014
- Dr. Johannes Heidenhain GmbH
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring device including a scale having an integrated re...
- Patent number 7,667,188
- Issue date Feb 23, 2010
- Dr. Johannes Heidenhain GmbH
- Heinz Tovar
- G01 - MEASURING TESTING
Information Patent Grant
Optical position measuring system with a detector arrangement and m...
- Patent number 7,312,436
- Issue date Dec 25, 2007
- Dr. Johannes Heidenhain GmbH
- Heinz Tovar
- G01 - MEASURING TESTING
Information Patent Grant
Optical position-measuring device
- Patent number 6,497,049
- Issue date Dec 24, 2002
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POSITION MEASURING INSTRUMENT
- Publication number 20130334409
- Publication date Dec 19, 2013
- Johann Oberhauser
- G01 - MEASURING TESTING
Information Patent Application
SCALE FOR A POSITION-MEASURING DEVICE AND POSITION-MEASURING DEVICE
- Publication number 20080290262
- Publication date Nov 27, 2008
- Heinz Tovar
- G01 - MEASURING TESTING
Information Patent Application
POSITION-MEASURING DEVICE
- Publication number 20080257951
- Publication date Oct 23, 2008
- Elmar MAYER
- G01 - MEASURING TESTING
Information Patent Application
Optical position measuring system
- Publication number 20060043274
- Publication date Mar 2, 2006
- Heinz Tovar
- G01 - MEASURING TESTING