Heita KIMIZUKA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Adjusting method of charged particle beam device and charged partic...
- Patent number 12,001,521
- Issue date Jun 4, 2024
- HITACHI HIGH-TECH CORPORATION
- Heita Kimizuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for deriving electrical characteristics and non-transitory c...
- Patent number 11,776,103
- Issue date Oct 3, 2023
- HITACHI HIGH-TECH CORPORATION
- Heita Kimizuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,749,494
- Issue date Sep 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for deriving electrical characteristics and non-transitory c...
- Patent number 11,694,325
- Issue date Jul 4, 2023
- HITACHI HIGH-TECH CORPORATION
- Heita Kimizuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,646,172
- Issue date May 9, 2023
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,398,367
- Issue date Jul 26, 2022
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,398,366
- Issue date Jul 26, 2022
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,335,535
- Issue date May 17, 2022
- HITACHI HIGH-TECH CORPORATION
- Yohei Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining irradiation conditions for charged particle...
- Patent number 11,232,929
- Issue date Jan 25, 2022
- HITACHI HIGH-TECH CORPORATION
- Heita Kimizuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and charged particle beam inspectio...
- Patent number 11,043,359
- Issue date Jun 22, 2021
- HITACHI HIGH-TECH CORPORATION
- Yohei Nakamura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam System
- Publication number 20240177964
- Publication date May 30, 2024
- Hitachi High-Tech Corporation
- Heita KIMIZUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM
- Publication number 20240151665
- Publication date May 9, 2024
- Hitachi High-Tech Corporation
- Yohei NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
System for Deriving Electrical Characteristics and Non-Transitory C...
- Publication number 20240020816
- Publication date Jan 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Heita KIMIZUKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System for Deriving Electrical Characteristics and Non-Transitory C...
- Publication number 20230274417
- Publication date Aug 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Heita KIMIZUKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20230064202
- Publication date Mar 2, 2023
- HITACHI HIGH-TECH CORPORATION
- Kazuo OOTSUGA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20220102108
- Publication date Mar 31, 2022
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20220102109
- Publication date Mar 31, 2022
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Adjusting Method of Charged Particle Beam Device and Charged Partic...
- Publication number 20210327048
- Publication date Oct 21, 2021
- Hitachi High-Tech Corporation
- Heita KIMIZUKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210043412
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM INSPECTIO...
- Publication number 20210043419
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Yohei Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for Deriving Electrical Characteristics and Non-Transitory C...
- Publication number 20210042900
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Heita KIMIZUKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210043413
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210043415
- Publication date Feb 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Yohei Nakamura
- G01 - MEASURING TESTING
Information Patent Application
System for Deriving Electrical Characteristics and Non-Transitory C...
- Publication number 20210027455
- Publication date Jan 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Heita KIMIZUKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Determining Irradiation Conditions for Charged Particle...
- Publication number 20210027981
- Publication date Jan 28, 2021
- Hitachi High-Tech Corporation
- Heita KIMIZUKA
- H01 - BASIC ELECTRIC ELEMENTS

Heita KIMIZUKA

Person

Patents Grantslast 30 patents

Adjusting method of charged particle beam device and charged partic...

System for deriving electrical characteristics and non-transitory c...

Charged particle beam apparatus

System for deriving electrical characteristics and non-transitory c...

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Method for determining irradiation conditions for charged particle...

Charged particle beam apparatus and charged particle beam inspectio...

Patents Applicationslast 30 patents

Charged Particle Beam System

INSPECTION SYSTEM

System for Deriving Electrical Characteristics and Non-Transitory C...

System for Deriving Electrical Characteristics and Non-Transitory C...

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

Adjusting Method of Charged Particle Beam Device and Charged Partic...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM INSPECTIO...

System for Deriving Electrical Characteristics and Non-Transitory C...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

System for Deriving Electrical Characteristics and Non-Transitory C...

Method for Determining Irradiation Conditions for Charged Particle...