Hejie Li

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Schenectady, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of calibrating a wavelength-modulation spectroscopy apparatu...
- Patent number 8,217,376
- Issue date Jul 10, 2012
- GE Infrastructure Sensing, Inc.
- Xiaoyong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating a wavelength-modulation spectroscopy apparatu...
- Patent number 8,026,499
- Issue date Sep 27, 2011
- GE Infrastructure Sensing, Inc.
- Xiaoyong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength-modulation spectroscopy method and apparatus
- Patent number 7,957,001
- Issue date Jun 7, 2011
- GE Infrastructure Sensing, Inc.
- Xiaoyong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating a wavelength-modulation spectroscopy apparatus
- Patent number 7,943,915
- Issue date May 17, 2011
- GE Infrastructure Sensing, Inc.
- Xiaoyong Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF CALIBRATING A WAVELENGTH-MODULATION SPECTROSCOPY APPARATUS
- Publication number 20110181877
- Publication date Jul 28, 2011
- Xiaoyong Liu
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALIBRATING A WAVELENGTH-MODULATION SPECTROSCOPY APPARATUS
- Publication number 20110181876
- Publication date Jul 28, 2011
- Xiaoyong Liu
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALIBRATING A WAVELENGTH-MODULATION SPECTROSCOPY APPARATUS
- Publication number 20100089117
- Publication date Apr 15, 2010
- Xiaoyong Liu
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH-MODULATION SPECTROSCOPY METHOD AND APPARATUS
- Publication number 20100091278
- Publication date Apr 15, 2010
- Xiaoyong Liu
- G01 - MEASURING TESTING