Helen Liu

Person

Milpitas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for enhancing data processing throughput using le...
- Patent number 11,668,557
- Issue date Jun 6, 2023
- KLA Corporation
- Helen (Heng) Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for enhancing data processing throughput using le...
- Patent number 11,035,665
- Issue date Jun 15, 2021
- KLA Corporation
- Helen (Heng) Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-wavelength interferometry for defect classification
- Patent number 11,017,520
- Issue date May 25, 2021
- KLA Corporation
- Andrew Zeng
- G01 - MEASURING TESTING
Information Patent Grant
Process-induced excursion characterization
- Patent number 10,585,049
- Issue date Mar 10, 2020
- KLA-Tencor Corporation
- Helen (Heng) Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transparent film error correction pattern in wafer geometry system
- Patent number 10,571,248
- Issue date Feb 25, 2020
- KLA-Tencor Corporation
- Helen Liu
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reconstructing high-resolution point spread f...
- Patent number 10,217,190
- Issue date Feb 26, 2019
- KLA-Tencor Corporation
- Helen Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for regional phase unwrapping with pattern-assist...
- Patent number 9,897,433
- Issue date Feb 20, 2018
- KLA-Tencor Corporation
- Helen Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR ENHANCING DATA PROCESSING THROUGHPUT USING LE...
- Publication number 20210270598
- Publication date Sep 2, 2021
- Helen (Heng) Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Enhancing Data Processing Throughput Using Le...
- Publication number 20210033386
- Publication date Feb 4, 2021
- KLA Corporation
- Helen (Heng) Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multi-Wavelength Interferometry for Defect Classification
- Publication number 20200074617
- Publication date Mar 5, 2020
- KLA Corporation
- Andrew Zeng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Process-Induced Excursion Characterization
- Publication number 20190277777
- Publication date Sep 12, 2019
- KLA-Tencor Corporation
- Helen (Heng) Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Transparent Film Error Correction Pattern in Wafer Geometry System
- Publication number 20180195855
- Publication date Jul 12, 2018
- KLA-Tencor Corporation
- Helen Liu
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Reconstructing High-Resolution Point Spread F...
- Publication number 20180182067
- Publication date Jun 28, 2018
- KLA-Tencor Corporation
- Helen Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Regional Phase Unwrapping with Pattern-Assist...
- Publication number 20170241764
- Publication date Aug 24, 2017
- KLA-Tencor Corporation
- Helen Liu
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

System and method for enhancing data processing throughput using le...

System and method for enhancing data processing throughput using le...

Multi-wavelength interferometry for defect classification

Process-induced excursion characterization

Transparent film error correction pattern in wafer geometry system

System and method for reconstructing high-resolution point spread f...

Method and system for regional phase unwrapping with pattern-assist...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR ENHANCING DATA PROCESSING THROUGHPUT USING LE...

System and Method for Enhancing Data Processing Throughput Using Le...

Multi-Wavelength Interferometry for Defect Classification

Process-Induced Excursion Characterization

Transparent Film Error Correction Pattern in Wafer Geometry System

System and Method for Reconstructing High-Resolution Point Spread F...

Method and System for Regional Phase Unwrapping with Pattern-Assist...