Helga Weiss

Person

Boeblingen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method of producing a calibration standard for 2-D and 3-D profilom...
- Patent number 6,218,264
- Issue date Apr 17, 2001
- International Business Machines Corporation
- Johann W. Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Micromechanical sensor for AFM/STM profilometry
- Patent number 6,091,124
- Issue date Jul 18, 2000
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Micro-mechanically fabricated read/write head with a strengthening...
- Patent number 6,088,320
- Issue date Jul 11, 2000
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Calibration standard for 2-D and 3-D profilometry in the sub-nanome...
- Patent number 5,960,255
- Issue date Sep 28, 1999
- International Business Machines Corporation
- Johann W. Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Calibration standard for 2-D and 3-D profilometry in the sub-nanome...
- Patent number 5,665,905
- Issue date Sep 9, 1997
- International Business Machines Corporation
- Johann W. Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Calibration standards for profilometers and methods of producing them
- Patent number 5,578,745
- Issue date Nov 26, 1996
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Calibration standard for 2-D and 3-D profilometry in the sub-nanome...
- Patent number 5,534,359
- Issue date Jul 9, 1996
- International Business Machines Corporation
- Johann W. Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Ultrafine silicon tips for AFM/STM profilometry
- Patent number 5,382,795
- Issue date Jan 17, 1995
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of producing ultrafine silicon tips for the AFM/STM profilom...
- Patent number 5,242,541
- Issue date Sep 7, 1993
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of producing micromechanical sensors for the AFM/STM profilo...
- Patent number 5,116,462
- Issue date May 26, 1992
- International Business Machines Corporation
- Johann W. Bartha
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of producing micromechanical sensors for the AFM/STM profilo...
- Patent number 5,051,379
- Issue date Sep 24, 1991
- International Business Machines Corporation
- Thomas Bayer
- B82 - NANO-TECHNOLOGY

Helga Weiss

Person

Patents Grantslast 30 patents

Method of producing a calibration standard for 2-D and 3-D profilom...

Micromechanical sensor for AFM/STM profilometry

Micro-mechanically fabricated read/write head with a strengthening...

Calibration standard for 2-D and 3-D profilometry in the sub-nanome...

Calibration standard for 2-D and 3-D profilometry in the sub-nanome...

Calibration standards for profilometers and methods of producing them

Calibration standard for 2-D and 3-D profilometry in the sub-nanome...

Ultrafine silicon tips for AFM/STM profilometry

Method of producing ultrafine silicon tips for the AFM/STM profilom...

Method of producing micromechanical sensors for the AFM/STM profilo...

Method of producing micromechanical sensors for the AFM/STM profilo...