Helmut Banzhof

Person

Pfullingen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-beam scanning electron beam device and methods of using the same
- Patent number 9,153,413
- Issue date Oct 6, 2015
- Applied Materials Israel, Ltd.
- Gilad Almogy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution gas field ion column with reduced sample load
- Patent number 8,735,847
- Issue date May 27, 2014
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Helmut Banzhof
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and a method of operating a charged pa...
- Patent number 8,294,096
- Issue date Oct 23, 2012
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Helmut Banzhof
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arrangement and method for the contrast improvement in a charged pa...
- Patent number 8,164,067
- Issue date Apr 24, 2012
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Achromatic mass separator
- Patent number 8,049,180
- Issue date Nov 1, 2011
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method for operating a charged...
- Patent number 7,838,830
- Issue date Nov 23, 2010
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-function module for an electron beam column
- Patent number 7,800,075
- Issue date Sep 21, 2010
- Benyamin Buller
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged particle beam device with aperture
- Patent number 7,763,866
- Issue date Jul 27, 2010
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Jürgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam column for writing shaped electron beams
- Patent number 7,427,765
- Issue date Sep 23, 2008
- Jeol, Ltd.
- Benyamin Buller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple electron beam device
- Patent number 7,282,711
- Issue date Oct 16, 2007
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Dieter Winkler
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND A METHOD OF OPERATING A CHARGED PA...
- Publication number 20110253893
- Publication date Oct 20, 2011
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Helmut BANZHOF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH THROUGHPUT SEM TOOL
- Publication number 20110163229
- Publication date Jul 7, 2011
- APPLIED MATERIALS ISRAEL, LTD.
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH THROUGHPUT SEM TOOL
- Publication number 20100320382
- Publication date Dec 23, 2010
- APPLIED MATERIALS ISRAEL, LTD.
- Gilad Almogy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARRANGEMENT AND METHOD FOR THE CONTRAST IMPROVEMENT IN A CHARGED PA...
- Publication number 20100200748
- Publication date Aug 12, 2010
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pavel ADAMEC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION GAS FIELD ION COLUMN WITH REDUCED SAMPLE LOAD
- Publication number 20090146074
- Publication date Jun 11, 2009
- ICT Integrated Circuit Testing Gesellschaft fuer Halbleiterprueftechnik mbH
- Helmut BANZHOF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-FUNCTION MODULE FOR AN ELECTRON BEAM COLUMN
- Publication number 20080308751
- Publication date Dec 18, 2008
- JEOL, Inc.
- Benyamin Buller
- B82 - NANO-TECHNOLOGY
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR OPERATING A CHARGED...
- Publication number 20080258060
- Publication date Oct 23, 2008
- JUERGEN FROSIEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACHROMATIC MASS SEPARATOR
- Publication number 20080185514
- Publication date Aug 7, 2008
- JUERGEN FROSIEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM APPARATUS AND METHOD FOR ALIGNING SAME
- Publication number 20080073583
- Publication date Mar 27, 2008
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Thomas JASINSKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device with Aperture
- Publication number 20070257207
- Publication date Nov 8, 2007
- Jurgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam column for writing shaped electron beams
- Publication number 20070085033
- Publication date Apr 19, 2007
- APPLIED MATERIALS, INC.
- Benyamin Buller
- B82 - NANO-TECHNOLOGY
Information Patent Application
Multiple electron beam device
- Publication number 20040256556
- Publication date Dec 23, 2004
- Dieter Winkler
- B82 - NANO-TECHNOLOGY

Helmut Banzhof

Person

Patents Grantslast 30 patents

Multi-beam scanning electron beam device and methods of using the same

High resolution gas field ion column with reduced sample load

Charged particle beam device and a method of operating a charged pa...

Arrangement and method for the contrast improvement in a charged pa...

Achromatic mass separator

Charged particle beam apparatus and method for operating a charged...

Multi-function module for an electron beam column

Charged particle beam device with aperture

Electron beam column for writing shaped electron beams

Multiple electron beam device

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE AND A METHOD OF OPERATING A CHARGED PA...

HIGH THROUGHPUT SEM TOOL

HIGH THROUGHPUT SEM TOOL

ARRANGEMENT AND METHOD FOR THE CONTRAST IMPROVEMENT IN A CHARGED PA...

HIGH RESOLUTION GAS FIELD ION COLUMN WITH REDUCED SAMPLE LOAD

MULTI-FUNCTION MODULE FOR AN ELECTRON BEAM COLUMN

CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR OPERATING A CHARGED...

ACHROMATIC MASS SEPARATOR

ION BEAM APPARATUS AND METHOD FOR ALIGNING SAME

Charged Particle Beam Device with Aperture

Electron beam column for writing shaped electron beams

Multiple electron beam device