Helmut Baumgart

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Mahopac, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for nondestructive measurement of minority carrier diffusion...
- Patent number 6,346,821
- Issue date Feb 12, 2002
- Infineon Technologies AG
- Helmut Baumgart
- G01 - MEASURING TESTING
Information Patent Grant
Method for nondestructive measurement of dopant concentrations and...
- Patent number 6,294,919
- Issue date Sep 25, 2001
- Infineon Technologies AG
- Helmut Baumgart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for making strain-compensated bonded silicon-on-insulator m...
- Patent number 5,261,999
- Issue date Nov 16, 1993
- North American Philips Corporation
- Ronald D. Pinker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming improved encapsulation layer
- Patent number 4,990,464
- Issue date Feb 5, 1991
- North American Philips Corp.
- Helmut Baumgart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing single crystal layers on insulators
- Patent number 4,555,300
- Issue date Nov 26, 1985
- North American Philips Corporation
- Emil Arnold
- H01 - BASIC ELECTRIC ELEMENTS