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Helmut Becker-Ross
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Berlin, DD
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last 30 patents
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Patent Grant
Device for the investigation of highly resolved partial spectra of...
Patent number
4,940,325
Issue date
Jul 10, 1990
Akademie der Wissenschaften der DDR
Helmut Becker-Ross
G01 - MEASURING TESTING
Information
Patent Grant
Adjustable echelle spectrometer arrangement and method for its adju...
Patent number
4,856,898
Issue date
Aug 15, 1989
Jenoptik Jena G.m.b.H.
Helmut Becker-Ross
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for the positioning of ends of flexible light-conducting...
Patent number
4,759,598
Issue date
Jul 26, 1988
Jenoptik Jena G.m.b.H.
Joachim Mohr
G02 - OPTICS
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Patent Grant
Method and arrangement for multielement analyse
Patent number
4,711,572
Issue date
Dec 8, 1987
Jenoptik Jena G.m.b.H.
Winfried Quillfeldt
G01 - MEASURING TESTING
Information
Patent Grant
Optical system for spectral analysis devices
Patent number
4,690,559
Issue date
Sep 1, 1987
Jenoptik Jena G.m.b.H.
Stefan Florek
G01 - MEASURING TESTING