Helmut Fischer

Person

Oberageri, CH

People

Patents Grantslast 30 patents

Information Patent Grant
Measuring system, measuring arrangement and method for determining...
- Patent number 11,867,666
- Issue date Jan 9, 2024
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and detection of measurement signals during a pene...
- Patent number 11,385,151
- Issue date Jul 12, 2022
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system, measuring arrangement, and method for determining...
- Patent number 10,837,888
- Issue date Nov 17, 2020
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Method for electronic control of a measurement stand
- Patent number 9,835,439
- Issue date Dec 5, 2017
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Helmut Fischer
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for electronically activating a measurement stand, and measu...
- Patent number 9,772,205
- Issue date Sep 26, 2017
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe for measuring the thickness of thin layers, and met...
- Patent number 9,605,940
- Issue date Mar 28, 2017
- Helmut Fischer GbmH Institut für Elektronik und Messtechnik
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe with shielding element for measuring the thickness...
- Patent number 9,435,629
- Issue date Sep 6, 2016
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Measurement stand and method of its electrical control
- Patent number 8,745,889
- Issue date Jun 10, 2014
- Helmut Fischer GmbH Institut für Elektronik und Messtechnik
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Calibration standard
- Patent number 7,784,325
- Issue date Aug 31, 2010
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measurement of the thickness of thin layer...
- Patent number 7,690,243
- Issue date Apr 6, 2010
- Immobiliengesellschaft Helmut Fischer GmbH & Co. KG
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe, especially for a device for the measurement of the...
- Patent number 7,472,491
- Issue date Jan 6, 2009
- Immobiliengesellschaft Helmut Fischer GmbH Co. KG
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Calibration standard
- Patent number 7,448,250
- Issue date Nov 11, 2008
- Immobiliengesellschaft Helmut Fischer GmbH & Co. KG
- Helmut Fischer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING SYSTEM, MEASURING ARRANGEMENT AND METHOD FOR DETERMINING...
- Publication number 20220074838
- Publication date Mar 10, 2022
- HELMUT FISCHER GMBH INSTITUTE FUR ELEKTRONIK UND MESSTECHNIK
- HELMUT FISCHER
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE AND DETECTION OF MEASUREMENT SIGNALS DURING A PENE...
- Publication number 20210208041
- Publication date Jul 8, 2021
- Helmut Fischer GmbH Institut fur Elektronik und Messtechnik
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM, MEASURING ARRANGEMENT AND METHOD FOR DETERMINING...
- Publication number 20210116344
- Publication date Apr 22, 2021
- Helmut Fischer GmbH Institut fur Elektronik und Messtechnik
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM, MEASURING ARRANGEMENT, AND METHOD FOR DETERMINING...
- Publication number 20190025172
- Publication date Jan 24, 2019
- Helmut Fischer GmbH Institut für Elektronik und Messtechink
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ELECTRONIC CONTROL OF A MEASUREMENT STAND
- Publication number 20160258739
- Publication date Sep 8, 2016
- Helmut Fischer GmbH Institut fur Elektronik und Messtechnik
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ELECTRONICALLY ACTIVATING A MEASUREMENT STAND, AND MEASU...
- Publication number 20150226586
- Publication date Aug 13, 2015
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE FOR MEASURING THE THICKNESS OF THIN LAYERS, AND MET...
- Publication number 20140203802
- Publication date Jul 24, 2014
- Helmut Fischer GmbH Institut fur Elektronik und Messtechnik
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Application
Method and device for measuring the thickness of thin layers over l...
- Publication number 20110271750
- Publication date Nov 10, 2011
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Application
Measuring probe for non-destructive measuring of the thickness of t...
- Publication number 20110260720
- Publication date Oct 27, 2011
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Application
Measuring probe for non-destructive measuring of the thickness of t...
- Publication number 20110260721
- Publication date Oct 27, 2011
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT STAND AND METHOD OF ITS ELECTRICAL CONTROL
- Publication number 20100241397
- Publication date Sep 23, 2010
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measurement of the thickness of thin layer...
- Publication number 20070289361
- Publication date Dec 20, 2007
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Application
Measuring probe, especially for a device for the measurement of the...
- Publication number 20070186434
- Publication date Aug 16, 2007
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Application
Calibration standard
- Publication number 20070119229
- Publication date May 31, 2007
- Helmut Fischer
- G01 - MEASURING TESTING
Information Patent Application
Calibration standard
- Publication number 20060284089
- Publication date Dec 21, 2006
- Helmut Fischer
- G01 - MEASURING TESTING

Helmut Fischer

Person

Patents Grantslast 30 patents

Measuring system, measuring arrangement and method for determining...

Measuring device and detection of measurement signals during a pene...

Measuring system, measuring arrangement, and method for determining...

Method for electronic control of a measurement stand

Method for electronically activating a measurement stand, and measu...

Measuring probe for measuring the thickness of thin layers, and met...

Measuring probe with shielding element for measuring the thickness...

Measurement stand and method of its electrical control

Calibration standard

Method and apparatus for measurement of the thickness of thin layer...

Measuring probe, especially for a device for the measurement of the...

Calibration standard

Patents Applicationslast 30 patents

MEASURING SYSTEM, MEASURING ARRANGEMENT AND METHOD FOR DETERMINING...

MEASURING DEVICE AND DETECTION OF MEASUREMENT SIGNALS DURING A PENE...

MEASURING SYSTEM, MEASURING ARRANGEMENT AND METHOD FOR DETERMINING...

MEASURING SYSTEM, MEASURING ARRANGEMENT, AND METHOD FOR DETERMINING...

METHOD FOR ELECTRONIC CONTROL OF A MEASUREMENT STAND

METHOD FOR ELECTRONICALLY ACTIVATING A MEASUREMENT STAND, AND MEASU...

MEASURING PROBE FOR MEASURING THE THICKNESS OF THIN LAYERS, AND MET...

Method and device for measuring the thickness of thin layers over l...

Measuring probe for non-destructive measuring of the thickness of t...

Measuring probe for non-destructive measuring of the thickness of t...

MEASUREMENT STAND AND METHOD OF ITS ELECTRICAL CONTROL

Method and apparatus for measurement of the thickness of thin layer...

Measuring probe, especially for a device for the measurement of the...

Calibration standard

Calibration standard