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Helmut Teichmann

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  • Zurich, CH
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Patents Grantslast 30 patents

  • Information Patent Grant

    Control device, optical filter system, and control method
    • Patent number 12,259,275
    • Issue date Mar 25, 2025
    • Hamamatsu Photonics K.K.
    • Peter Seitz
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Monitoring device, optical filter system, monitoring method, and cu...
    • Patent number 12,189,113
    • Issue date Jan 7, 2025
    • Hamamatsu Photonics K.K.
    • Andreas Durandi
    • G02 - OPTICS
  • Information Patent Grant

    Optical filter system
    • Patent number 11,480,783
    • Issue date Oct 25, 2022
    • Hamamatsu Photonics K.K.
    • Helmut Teichmann
    • G02 - OPTICS
  • Information Patent Grant

    Spectroscopic module
    • Patent number 8,411,269
    • Issue date Apr 2, 2013
    • Hamamatsu Photonics K.K.
    • Katsumi Shibayama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroscopic module
    • Patent number 8,368,885
    • Issue date Feb 5, 2013
    • Hamamatsu Photonics K.K.
    • Katsumi Shibayama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Photodetector and spectrometer using the same
    • Patent number 8,125,636
    • Issue date Feb 28, 2012
    • Hamamatsu Photonics K.K.
    • Mitsuaki Kageyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroscopic module
    • Patent number 8,068,224
    • Issue date Nov 29, 2011
    • Hamamatsu Photonics K.K.
    • Katsumi Shibayama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroscopic module
    • Patent number 8,068,223
    • Issue date Nov 29, 2011
    • Hamamatsu Photonics K.K.
    • Tomofumi Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroscopic module
    • Patent number 8,049,887
    • Issue date Nov 1, 2011
    • Hamamatsu Photonics K.K.
    • Tomofumi Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroscopic module
    • Patent number 8,045,157
    • Issue date Oct 25, 2011
    • Hamamatsu Photonics K.K.
    • Katsumi Shibayama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroscopy module
    • Patent number 8,045,160
    • Issue date Oct 25, 2011
    • Hamamatsu Photonics K.K.
    • Katsumi Shibayama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroscopic module
    • Patent number 8,045,155
    • Issue date Oct 25, 2011
    • Hamamatsu Photonics K.K.
    • Tomofumi Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroscopy module
    • Patent number 7,961,317
    • Issue date Jun 14, 2011
    • Hamamatsu Photonics K.K.
    • Katsumi Shibayama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectrometer
    • Patent number 7,605,917
    • Issue date Oct 20, 2009
    • Hamamatsu Photonics K.K.
    • Helmut Teichmann
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Photodetector and spectrometer using the same
    • Patent number 7,081,955
    • Issue date Jul 25, 2006
    • Hamamatsu Photonics K.K.
    • Helmut Teichmann
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectrometer
    • Patent number 6,081,331
    • Issue date Jun 27, 2000
    • Gretag-Macbeth AG
    • Helmut Teichmann
    • G02 - OPTICS

Patents Applicationslast 30 patents

  • Information Patent Application

    SLANTED OPTICAL COHERENCE TOMOGRAPHY IMAGING FOR HIGH-SPEED INSPECTION
    • Publication number 20230213327
    • Publication date Jul 6, 2023
    • Hamamatsu Photonics K.K.
    • Peter SEITZ
    • G01 - MEASURING TESTING
  • Information Patent Application

    MONITORING DEVICE, OPTICAL FILTER SYSTEM, MONITORING METHOD, AND CU...
    • Publication number 20220075176
    • Publication date Mar 10, 2022
    • Hamamatsu Photonics K.K.
    • Andreas DURANDI
    • G02 - OPTICS
  • Information Patent Application

    CONTROL DEVICE, OPTICAL FILTER SYSTEM, AND CONTROL METHOD
    • Publication number 20220003603
    • Publication date Jan 6, 2022
    • Hamamatsu Photonics K.K.
    • Peter SEITZ
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL FILTER SYSTEM
    • Publication number 20200116992
    • Publication date Apr 16, 2020
    • Hamamatsu Photonics K.K.
    • Helmut TEICHMANN
    • G02 - OPTICS
  • Information Patent Application

    SPECTROSCOPIC MODULE
    • Publication number 20120276287
    • Publication date Nov 1, 2012
    • Hamamatsu Photonics K.K.
    • Katsumi SHIBAYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECTROSCOPY MODULE
    • Publication number 20110205538
    • Publication date Aug 25, 2011
    • Hamamatsu Photonics K.K.
    • Katsumi SHIBAYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECTROSCOPY MODULE
    • Publication number 20100315633
    • Publication date Dec 16, 2010
    • HAMAMATSU PHOTONICS K. K.
    • Katsumi Shibayama
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECTROSCOPIC MODULE
    • Publication number 20100238439
    • Publication date Sep 23, 2010
    • Tomofumi Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECTROSCOPIC MODULE
    • Publication number 20100214563
    • Publication date Aug 26, 2010
    • Hamamatsu Photonics K.K.
    • Tomofumi Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECTROSCOPIC MODULE
    • Publication number 20100208259
    • Publication date Aug 19, 2010
    • HAMAMATSU PHOTONICS K.K.
    • Tomofumi Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECTROSCOPIC MODULE
    • Publication number 20100208257
    • Publication date Aug 19, 2010
    • Hamamatsu Photonics K. K.
    • Katsumi Shibayama
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECTROSCOPIC MODULE
    • Publication number 20100201980
    • Publication date Aug 12, 2010
    • HAMAMATSU PHTONICS K.K.
    • Katsumi Shibayama
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECTROSCOPIC MODULE
    • Publication number 20100103412
    • Publication date Apr 29, 2010
    • HAMAMATSU PHOTONICS K. K.
    • Katsumi Shibayama
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECTROMETER MOUNT AND MEASURING APPARATUS INCLUDING SAME
    • Publication number 20090135420
    • Publication date May 28, 2009
    • HAMAMATSU PHOTONICS K. K.
    • Dietmar Hiller
    • G01 - MEASURING TESTING
  • Information Patent Application

    Photodetector and Spectrometer Using the Same
    • Publication number 20080259331
    • Publication date Oct 23, 2008
    • Mitsuaki Kageyama
    • G01 - MEASURING TESTING
  • Information Patent Application

    Spectrometer
    • Publication number 20070211250
    • Publication date Sep 13, 2007
    • Helmut Teichmann
    • G01 - MEASURING TESTING
  • Information Patent Application

    Photodetector and spectrometer using the same
    • Publication number 20040239931
    • Publication date Dec 2, 2004
    • Hamamatsu Photonics K.K.
    • Helmut Teichmann
    • G01 - MEASURING TESTING