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Helmut W. W. Werner

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  • Eindhoven, NL
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Patents Grantslast 30 patents

  • Information Patent Grant

    X-ray spectrometer
    • Patent number 4,280,049
    • Issue date Jul 21, 1981
    • U.S. Philips Corporation
    • Helmut W. W. Werner
    • G01 - MEASURING TESTING