Hemalatha Erva

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Data flow management in generating profile models used in optical m...
- Patent number 7,783,669
- Issue date Aug 24, 2010
- Tokyo Electron Limited
- Hong Qiu
- G01 - MEASURING TESTING
Information Patent Grant
Data flow management in generating different signal formats used in...
- Patent number 7,765,234
- Issue date Jul 27, 2010
- Tokyo Electron Limited
- Hong Qiu
- G01 - MEASURING TESTING
Information Patent Grant
Allocating processing units to processing clusters to generate simu...
- Patent number 7,765,076
- Issue date Jul 27, 2010
- Tokyo Electron Limited
- Hemalatha Erva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Allocating processing units to generate simulated diffraction signa...
- Patent number 7,742,888
- Issue date Jun 22, 2010
- Tokyo Electron Limited
- Hemalatha Erva
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Allocating processing units to processing clusters to generate simu...
- Publication number 20080115140
- Publication date May 15, 2008
- TOKYO ELECTRON LIMITED
- Hemalatha Erva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Data flow management in generating profile models used in optical m...
- Publication number 20080091724
- Publication date Apr 17, 2008
- TOKYO ELECTRON LIMITED
- Hong Qiu
- G01 - MEASURING TESTING
Information Patent Application
Data flow management in generating different signal formats used in...
- Publication number 20080089574
- Publication date Apr 17, 2008
- TOKYO ELECTRON LIMITED
- Hong Qiu
- G01 - MEASURING TESTING
Information Patent Application
Allocating processing units to generate simulated diffraction signa...
- Publication number 20080027565
- Publication date Jan 31, 2008
- TOKYO ELECTRON LIMITED
- Hemalatha Erva
- G01 - MEASURING TESTING