Hendra Sudin

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Chu-Pei City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Vertical probe device
- Patent number 7,400,156
- Issue date Jul 15, 2008
- MJC Probe Incorporation
- Shih-Chang Wu
- G01 - MEASURING TESTING
Information Patent Grant
Vertical type high frequency probe card
- Patent number 7,368,928
- Issue date May 6, 2008
- MJC Probe Incorporation
- Hsin-Hung Lin
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit probe card
- Patent number 7,154,284
- Issue date Dec 26, 2006
- MJC Probe Incorporation
- Horng-Kuang Fan
- G01 - MEASURING TESTING
Information Patent Grant
Probe device for electrical testing an integrated circuit device an...
- Patent number 7,053,636
- Issue date May 30, 2006
- MJC Probe Incorporation
- Hendra Sudin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VERTICAL TYPE HIGH FREQUENCY PROBE CARD
- Publication number 20080054918
- Publication date Mar 6, 2008
- MJC PROBE INCORPORATION
- Hsin-Hung Lin
- G01 - MEASURING TESTING
Information Patent Application
Vertical probe device
- Publication number 20080054919
- Publication date Mar 6, 2008
- MJC PROBE INCORPORATION
- Shih-Chang Wu
- G01 - MEASURING TESTING
Information Patent Application
Vertical probe card, probes for vertical probe card and method of m...
- Publication number 20060170440
- Publication date Aug 3, 2006
- MJC PROBE INCORPORATION
- Hendra Sudin
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PROBE CARD
- Publication number 20060022686
- Publication date Feb 2, 2006
- MJC PROBE INCORPORATION
- Horng-Kuang Fan
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE AND PROBE CARD USING THE SAME
- Publication number 20050200375
- Publication date Sep 15, 2005
- MJC PROBE INCORPORATION
- Hendra Sudin
- G01 - MEASURING TESTING