Hendricus J M Veendrick

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Heeze, NL

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Patents Grantslast 30 patents

Information Patent Grant
Monitoring physical operating parameters of an integrated circuit
- Patent number 7,928,882
- Issue date Apr 19, 2011
- NXP B.V.
- Hendricus J M Veendrick
- G01 - MEASURING TESTING
Information Patent Grant
Intergrated circuit self-test architecture
- Patent number 7,710,136
- Issue date May 4, 2010
- NXP B.V.
- Marcel Pelgrom
- G01 - MEASURING TESTING