Hendricus Joseph Maria Veendrick

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Heeze, NL

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Patents Grantslast 30 patents

Information Patent Grant
DLL for period jitter measurement
- Patent number 8,203,368
- Issue date Jun 19, 2012
- NXP B.V.
- Marcel J. M. Pelgrom
- G01 - MEASURING TESTING
Information Patent Grant
Signal integrity self-test architecture
- Patent number 7,478,302
- Issue date Jan 13, 2009
- NXP B.V.
- Hendricus Joseph Maria Veendrick
- G11 - INFORMATION STORAGE
Information Patent Grant
Operating long on-chip buses
- Patent number 7,439,759
- Issue date Oct 21, 2008
- NXP B.V.
- Atul Katoch
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
FLEXIBLE CMOS LIBRARY ARCHITECTURE FOR LEAKAGE POWER AND VARIABILIT...
- Publication number 20110156755
- Publication date Jun 30, 2011
- NXP B.V.
- Hendricus Joseph Maria Veendrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION CIRCUITRY FOR DETECTING BONDING CONDITIONS ON BOND PADS
- Publication number 20110140730
- Publication date Jun 16, 2011
- NXP B.V.
- Victor Zieren
- G01 - MEASURING TESTING
Information Patent Application
DLL FOR PERIOD JITTER MEASUREMENT
- Publication number 20110128055
- Publication date Jun 2, 2011
- NXP B.V.
- Marcel J.M. Pelgrom
- G01 - MEASURING TESTING
Information Patent Application
LITHOGRAPHY ROBUSTNESS MONITOR
- Publication number 20100308329
- Publication date Dec 9, 2010
- NXP B.V.
- Harold Gerardus Pieter Hendrikus Benten
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Intergrated Circuit Self-Test Architecture
- Publication number 20080272797
- Publication date Nov 6, 2008
- Koninklijke Philips Electronics N.V.
- Marcellinus Johannes Maria Pelgrom
- G01 - MEASURING TESTING