Hendrik G. Tappel

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
User interface for an electron microscope
- Patent number 9,865,427
- Issue date Jan 9, 2018
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
User interface for an electron microscope
- Patent number 9,025,018
- Issue date May 5, 2015
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hermetically sealed housing with electrical feed-in
- Patent number 8,354,587
- Issue date Jan 15, 2013
- FEI Company
- Hendrik Gezinus Tappel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Compact scanning electron microscope
- Patent number 8,309,921
- Issue date Nov 13, 2012
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact scanning electron microscope
- Patent number 7,906,762
- Issue date Mar 15, 2011
- FEI Company
- Mart Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stage assembly, particle-optical apparatus comprising such a stage...
- Patent number 7,474,419
- Issue date Jan 6, 2009
- FEI Company
- Hendrik Gezinus Tappel
- G01 - MEASURING TESTING
Information Patent Grant
Method for the removal of a microscopic sample from a substrate
- Patent number 7,408,178
- Issue date Aug 5, 2008
- FEI Company
- Hendrik Gezinus Tappel
- G01 - MEASURING TESTING
Information Patent Grant
Cluster tool for microscopic processing of samples
- Patent number 7,301,157
- Issue date Nov 27, 2007
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for manipulating a microscopic sample
- Patent number 7,005,636
- Issue date Feb 28, 2006
- FEI Company
- Hendrik Gezinus Tappel
- G01 - MEASURING TESTING
Information Patent Grant
Method for the manufacture and transmissive irradiation of a sample...
- Patent number 6,963,068
- Issue date Nov 8, 2005
- FEI Company
- Peter Emile Stephan Joseph Asselbergs
- G01 - MEASURING TESTING
Information Patent Grant
Valve device for a particle beam apparatus
- Patent number 5,093,578
- Issue date Mar 3, 1992
- U.S. Philips Corporation
- Hendrik G. Tappel
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
USER INTERFACE FOR AN ELECTRON MICROSCOPE
- Publication number 20150332891
- Publication date Nov 19, 2015
- FEI Company
- MART PETRUS MARIA BIERHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPACT SCANNING ELECTRON MICROSCOPE
- Publication number 20110133083
- Publication date Jun 9, 2011
- FEI Company
- MART PETRUS MARIA BIERHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Compact Scanning Electron Microscope
- Publication number 20100230590
- Publication date Sep 16, 2010
- FEI Company
- Mart Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
User Interface for an Electron Microscope
- Publication number 20100194874
- Publication date Aug 5, 2010
- FEI Company
- Mart Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPACT SCANNING ELECTRON MICROSCOPE
- Publication number 20100171037
- Publication date Jul 8, 2010
- FEI Company
- Mart Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HERMETICALLY SEALED HOUSING WITH ELECTRICAL FEED-IN
- Publication number 20090200489
- Publication date Aug 13, 2009
- FEI Company
- Hendrik Gezinus Tappel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Stage assembly, particle-optical apparatus comprising such a stage...
- Publication number 20070125958
- Publication date Jun 7, 2007
- FEI Company
- Hendrik Gezinus Tappel
- G01 - MEASURING TESTING
Information Patent Application
Method for the removal of a microscopic sample from a substrate
- Publication number 20060017016
- Publication date Jan 26, 2006
- FEI Company
- Hendrik Gezinus Tappel
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Method of expeditiously using a focused-beam apparatus to extract s...
- Publication number 20050054115
- Publication date Mar 10, 2005
- FEI Company
- Hanno Sebastian Von Harrach
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for manipulating a microscopic sample
- Publication number 20040251412
- Publication date Dec 16, 2004
- FEI Company
- Hendrik Gezinus Tappel
- G01 - MEASURING TESTING
Information Patent Application
Method for the manufacture and transmissive irradiation of a sample...
- Publication number 20040144924
- Publication date Jul 29, 2004
- Peter Emile Stephan Joseph Asselbergs
- G01 - MEASURING TESTING

Hendrik G. Tappel

Person

Patents Grantslast 30 patents

User interface for an electron microscope

User interface for an electron microscope

Hermetically sealed housing with electrical feed-in

Compact scanning electron microscope

Compact scanning electron microscope

Stage assembly, particle-optical apparatus comprising such a stage...

Method for the removal of a microscopic sample from a substrate

Cluster tool for microscopic processing of samples

Method and apparatus for manipulating a microscopic sample

Method for the manufacture and transmissive irradiation of a sample...

Valve device for a particle beam apparatus

Patents Applicationslast 30 patents

USER INTERFACE FOR AN ELECTRON MICROSCOPE

COMPACT SCANNING ELECTRON MICROSCOPE

Compact Scanning Electron Microscope

User Interface for an Electron Microscope

COMPACT SCANNING ELECTRON MICROSCOPE

HERMETICALLY SEALED HOUSING WITH ELECTRICAL FEED-IN

Stage assembly, particle-optical apparatus comprising such a stage...

Method for the removal of a microscopic sample from a substrate

Method of expeditiously using a focused-beam apparatus to extract s...

Method and apparatus for manipulating a microscopic sample

Method for the manufacture and transmissive irradiation of a sample...