Hendrik Jan De Vos

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Composite scan path in a charged particle microscope
- Patent number 10,002,742
- Issue date Jun 19, 2018
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for analyzing an EDS signal
- Patent number 9,361,275
- Issue date Jun 7, 2016
- FEI Company
- Cornelis Sander Kooijman
- G01 - MEASURING TESTING
Information Patent Grant
Pattern modification schemes for improved FIB patterning
- Patent number 8,624,206
- Issue date Jan 7, 2014
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
COMPOSITE SCAN PATH IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20160118219
- Publication date Apr 28, 2016
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Analyzing an EDS Signal
- Publication number 20130277555
- Publication date Oct 24, 2013
- FEI Company
- Cornelis Sander Kooijman
- G01 - MEASURING TESTING
Information Patent Application
Pattern Modification Schemes for Improved FIB Patterning
- Publication number 20130092826
- Publication date Apr 18, 2013
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS