Hendrik Jan Hidde SMILDE

Person

Veldhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Metrology method and apparatus, lithographic system, device manufac...
- Patent number 11,466,980
- Issue date Oct 11, 2022
- ASML Netherlands B.V.
- Maurits Van Der Schaar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metrology method and apparatus, lithographic system, device manufac...
- Patent number 9,714,827
- Issue date Jul 25, 2017
- ASML Netherlands B.V.
- Maurits Van Der Schaar
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection method and apparatus, lithographic apparatus, lithograph...
- Patent number 8,223,347
- Issue date Jul 17, 2012
- ASML Netherlands B.V.
- Hendrik Jan Hidde Smilde
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Metrology Method and Apparatus, Lithographic System, Device Manufac...
- Publication number 20170314915
- Publication date Nov 2, 2017
- ASML NETHERLANDS B.V.
- Maurits Van Der Schaar
- G01 - MEASURING TESTING
Information Patent Application
Metrology Method and Apparatus, Lithographic System, Device Manufac...
- Publication number 20150145151
- Publication date May 28, 2015
- ASML NETHERLANDS B.V.
- Maurits Van Der Schaar
- G01 - MEASURING TESTING
Information Patent Application
Metrology Method and Apparatus, and Device Manufacturing Method
- Publication number 20120242970
- Publication date Sep 27, 2012
- ASML NETHERLANDS B.V.
- Hendrik Jan Hidde SMILDE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Method and Inspection Apparatus, Lithographic System and...
- Publication number 20120123581
- Publication date May 17, 2012
- ASML NETHERLANDS B.V.
- Hendrik Jan Hidde SMILDE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Substrate for Use in Metrology, Metrology Method and Device Manufac...
- Publication number 20120044470
- Publication date Feb 23, 2012
- ASML NETHERLANDS B.V.
- Hendrik Jan Hidde SMILDE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Inspection Apparatus and Method, Lithographic Apparatus and Lithogr...
- Publication number 20120033193
- Publication date Feb 9, 2012
- ASML NETHERLANDS B.V.
- Maurits VAN DER SCHAAR
- G01 - MEASURING TESTING
Information Patent Application
Substrate, a Method of Measuring a Property, an Inspection Apparat...
- Publication number 20110205518
- Publication date Aug 25, 2011
- ASML NETHERLANDS B.V.
- Marcus Adrianus Van De Kerkhof
- G02 - OPTICS
Information Patent Application
Substrate, an Inspection Apparatus, and a Lithographic Apparatus
- Publication number 20110194092
- Publication date Aug 11, 2011
- ASML NETHERLANDS B.V.
- Hendrik Jan Hidde Smilde
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Method and Apparatus, Lithographic Apparatus, Device Manu...
- Publication number 20110043791
- Publication date Feb 24, 2011
- ASML NETHERLANDS B.V.
- Hendrik Jan Hidde Smilde
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods and Scatterometers, Lithographic Systems, and Lithographic...
- Publication number 20110027704
- Publication date Feb 3, 2011
- ASML NETHERLANDS B.V.
- Hugo Augustinus Joseph Cramer
- G01 - MEASURING TESTING
Information Patent Application
Inspection Method and Apparatus, Lithographic Apparatus, Lithograph...
- Publication number 20110001978
- Publication date Jan 6, 2011
- ASML NETHERLANDS B.V.
- Hendrik Jan Hidde SMILDE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Hendrik Jan Hidde SMILDE

Person

Patents Grantslast 30 patents

Metrology method and apparatus, lithographic system, device manufac...

Metrology method and apparatus, lithographic system, device manufac...

Inspection method and apparatus, lithographic apparatus, lithograph...

Patents Applicationslast 30 patents

Metrology Method and Apparatus, Lithographic System, Device Manufac...

Metrology Method and Apparatus, Lithographic System, Device Manufac...

Metrology Method and Apparatus, and Device Manufacturing Method

Metrology Method and Inspection Apparatus, Lithographic System and...

Substrate for Use in Metrology, Metrology Method and Device Manufac...

Inspection Apparatus and Method, Lithographic Apparatus and Lithogr...

Substrate, a Method of Measuring a Property, an Inspection Apparat...

Substrate, an Inspection Apparatus, and a Lithographic Apparatus

Metrology Method and Apparatus, Lithographic Apparatus, Device Manu...

Methods and Scatterometers, Lithographic Systems, and Lithographic...

Inspection Method and Apparatus, Lithographic Apparatus, Lithograph...