Hendrik Johannes Jan Bolk

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Bornerbroek, NL

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Patents Grantslast 30 patents

Information Patent Grant
Radiation detector provided with an absorption chamber and a plural...
- Patent number 6,452,190
- Issue date Sep 17, 2002
- Koninklijke Philips Electronics N.V.
- Hendrik Johannes Jan Bolk
- G01 - MEASURING TESTING
Information Patent Grant
Radiation analysis apparatus
- Patent number 5,545,900
- Issue date Aug 13, 1996
- U.S. Philips Corporation
- Hendrik J. J. Bolk
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus with pulse amplitude shift correction and...
- Patent number 5,357,551
- Issue date Oct 18, 1994
- U.S. Philips Corporation
- Hendrik J. J. Bolk
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement for measuring radiation quanta, pulse discrimination de...
- Patent number 4,922,442
- Issue date May 1, 1990
- U.S. Philips Corporation
- Hendrik J. J. Bolk
- G01 - MEASURING TESTING
Information Patent Grant
Detection arrangement for detection of signal variations in a signal
- Patent number 4,866,300
- Issue date Sep 12, 1989
- U.S. Philips Corp.
- Hendrik J. J. Bolk
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method of determining the background corrected counts of radiation...
- Publication number 20050067581
- Publication date Mar 31, 2005
- Koninklijke Philips Electronics N.V
- Klaus Berhke
- G01 - MEASURING TESTING