Hendrik Nicolaas Slingerland

Person

Venlo, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Electric motor/generator, vehicle and wind turbine
- Patent number 12,155,288
- Issue date Nov 26, 2024
- Lightyear IPCo B.V.
- Hendrik Nicolaas Slingerland
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Emission noise correction of a charged particle source
- Patent number 10,453,647
- Issue date Oct 22, 2019
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite scan path in a charged particle microscope
- Patent number 10,002,742
- Issue date Jun 19, 2018
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mathematical image assembly in a scanning-type microscope
- Patent number 9,620,330
- Issue date Apr 11, 2017
- FEI Company
- Pavel Potocek
- G02 - OPTICS
Information Patent Grant
Particle optical apparatus with a predetermined final vacuum pressure
- Patent number 9,153,414
- Issue date Oct 6, 2015
- FEI Company
- Hendrik Nicolaas Slingerland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring the temperature of a sample carrier in a charge...
- Patent number 8,757,873
- Issue date Jun 24, 2014
- FEI Company
- Stephanus Hubertus Leonardus van den Boom
- G01 - MEASURING TESTING
Information Patent Grant
Method of use for a multipole detector for a transmission electron...
- Patent number 8,692,196
- Issue date Apr 8, 2014
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam blanker for interrupting a beam of charged particles
- Patent number 8,569,712
- Issue date Oct 29, 2013
- FEI Company
- Guido Martinus Henricus Knippels
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for localizing labels in a sample
- Patent number 8,306,291
- Issue date Nov 6, 2012
- FEI Company
- Hendrik Nicolaas Slingerland
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid phase plate
- Patent number 8,071,954
- Issue date Dec 6, 2011
- FEI Company
- Raymond Wagner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manipulator for rotating and translating a sample holder
- Patent number 7,884,326
- Issue date Feb 8, 2011
- FEI Company
- Jeroen van de Water
- G01 - MEASURING TESTING
Information Patent Grant
Manipulator for rotating and translating a sample holder
- Patent number 7,800,063
- Issue date Sep 21, 2010
- FEI Company
- Jeroen van de Water
Information Patent Grant
Cluster tool for microscopic processing of samples
- Patent number 7,301,157
- Issue date Nov 27, 2007
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
FOIL FOR USE WITH A DOUBLE CURVED SOLAR PANEL
- Publication number 20240097055
- Publication date Mar 21, 2024
- Durandus Kornelius DIJKEN
- B60 - VEHICLES IN GENERAL
Information Patent Application
ELECTRIC MOTOR/GENERATOR, VEHICLE AND WIND TURBINE
- Publication number 20220278586
- Publication date Sep 1, 2022
- Atlas Technologies Holding B.V.
- Hendrik Nicolaas SLINGERLAND
- B60 - VEHICLES IN GENERAL
Information Patent Application
EMISSION NOISE CORRECTION OF A CHARGED PARTICLE SOURCE
- Publication number 20180233322
- Publication date Aug 16, 2018
- FEI Company
- Ali Mohammadi Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE SCAN PATH IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20160118219
- Publication date Apr 28, 2016
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MATHEMATICAL IMAGE ASSEMBLY IN A SCANNING-TYPE MICROSCOPE
- Publication number 20150371815
- Publication date Dec 24, 2015
- FEI Company
- Pavel Potocek
- G02 - OPTICS
Information Patent Application
Imaging a Sample with Multiple Beams and Multiple Detectors
- Publication number 20150279615
- Publication date Oct 1, 2015
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Beam Blanker for Interrupting a Beam of Charged Particles
- Publication number 20120261586
- Publication date Oct 18, 2012
- FEI Company
- Guido Martinus Henricus Knippels
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Measuring the Temperature of a Sample Carrier in a Charge...
- Publication number 20120128028
- Publication date May 24, 2012
- FEI Company
- Stephanus Hubertus Leonardus van den Boom
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CORRECTING DISTORTIONS IN A PARTICLE-OPTICAL APPARATUS
- Publication number 20100072366
- Publication date Mar 25, 2010
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Hybrid Phase Plate
- Publication number 20090302217
- Publication date Dec 10, 2009
- FEI Company
- Raymond Wagner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR LOCALIZING LABELS IN A SAMPLE
- Publication number 20090220130
- Publication date Sep 3, 2009
- FEI COMPANY
- Hendrik Nicolaas Slingerland
- G01 - MEASURING TESTING
Information Patent Application
MANIPULATOR FOR ROTATING AND TRANSLATING A SAMPLE HOLDER
- Publication number 20080173813
- Publication date Jul 24, 2008
- FEI Company
- JEROEN VAN DE WATER
- G01 - MEASURING TESTING
Information Patent Application
Particle optical apparatus with a predetermined final vacuum pressure
- Publication number 20070176102
- Publication date Aug 2, 2007
- FEI Company
- Hendrik Nicolaas Slingerland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cluster tool for microscopic processing of samples
- Publication number 20070080291
- Publication date Apr 12, 2007
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS

Hendrik Nicolaas Slingerland

Person

Patents Grantslast 30 patents

Electric motor/generator, vehicle and wind turbine

Emission noise correction of a charged particle source

Composite scan path in a charged particle microscope

Mathematical image assembly in a scanning-type microscope

Particle optical apparatus with a predetermined final vacuum pressure

Method of measuring the temperature of a sample carrier in a charge...

Method of use for a multipole detector for a transmission electron...

Beam blanker for interrupting a beam of charged particles

Method for localizing labels in a sample

Hybrid phase plate

Manipulator for rotating and translating a sample holder

Manipulator for rotating and translating a sample holder

Cluster tool for microscopic processing of samples

Patents Applicationslast 30 patents

FOIL FOR USE WITH A DOUBLE CURVED SOLAR PANEL

ELECTRIC MOTOR/GENERATOR, VEHICLE AND WIND TURBINE

EMISSION NOISE CORRECTION OF A CHARGED PARTICLE SOURCE

COMPOSITE SCAN PATH IN A CHARGED PARTICLE MICROSCOPE

MATHEMATICAL IMAGE ASSEMBLY IN A SCANNING-TYPE MICROSCOPE

Imaging a Sample with Multiple Beams and Multiple Detectors

Beam Blanker for Interrupting a Beam of Charged Particles

Method of Measuring the Temperature of a Sample Carrier in a Charge...

METHOD FOR CORRECTING DISTORTIONS IN A PARTICLE-OPTICAL APPARATUS

Hybrid Phase Plate

METHOD FOR LOCALIZING LABELS IN A SAMPLE

MANIPULATOR FOR ROTATING AND TRANSLATING A SAMPLE HOLDER

Particle optical apparatus with a predetermined final vacuum pressure

Cluster tool for microscopic processing of samples