Hendrikus P. E. Vranken

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Weert, NL

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Patents Grantslast 30 patents

Information Patent Grant
Testing of an integrated circuit that contains secret information
- Patent number 9,041,411
- Issue date May 26, 2015
- NXP B.V.
- Erik J. Marinissen
- G01 - MEASURING TESTING
Information Patent Grant
Testing of an integrated circuit that contains secret information
- Patent number 8,539,292
- Issue date Sep 17, 2013
- NXP B.V.
- André K. Nieuwland
- G01 - MEASURING TESTING