Hendrikus Petrus Elisabeth Vranken

Follow

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit test method and test apparatus
- Patent number 8,281,197
- Issue date Oct 2, 2012
- NXP B.V.
- Hendrikus Petrus Elisabeth Vranken
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit arrangement and design method
- Patent number 7,945,828
- Issue date May 17, 2011
- NXP B.V.
- Hendrikus Petrus Elisabeth Vranken
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for data compression
- Patent number 7,558,994
- Issue date Jul 7, 2009
- NXP B.V.
- Hendrikus Petrus Elisabeth Vranken
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for selectively masking test responses
- Patent number 7,376,873
- Issue date May 20, 2008
- NXP B.V.
- Hendrikus Petrus Elisabeth Vranken
- G01 - MEASURING TESTING
Information Patent Grant
Data processor and method for using a data processor with debug cir...
- Patent number 7,293,258
- Issue date Nov 6, 2007
- NXP B.V.
- Hendrikus Petrus Elisabeth Vranken
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low pin count, high-speed boundary scan testing
- Patent number 7,124,340
- Issue date Oct 17, 2006
- Koninklijke Phillips Electronics N.V.
- Gerardus Arnoldus Antonius Bos
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING OF AN INTEGRATED CIRCUIT THAT CONTAINS SECRET INFORMATION
- Publication number 20100264932
- Publication date Oct 21, 2010
- NXP B.V.
- Erik Jan Marinissen
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF AN INTEGRATED CIRCUIT THAT CONTAINS SECRET INFORMATION
- Publication number 20100223515
- Publication date Sep 2, 2010
- NXP B.V.
- Andre Krijn Nieuwland
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TEST METHOD AND TEST APPARATUS
- Publication number 20090077439
- Publication date Mar 19, 2009
- NXP B.V.
- Hendrikus Petrus Elisabeth Vranken
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT ARRANGEMENT AND DESIGN METHOD
- Publication number 20090024893
- Publication date Jan 22, 2009
- Koninklijke Philips Electronics N.V.
- Hendrikus Petrus Elisabeth Vranken
- G01 - MEASURING TESTING
Information Patent Application
Data compression
- Publication number 20070011514
- Publication date Jan 11, 2007
- KONIKLIJKE PHILIPS ELECTRONICS
- Hendrikus Petrus Elisabeth Vranken
- G01 - MEASURING TESTING