Henning Hartmann

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Tegernheim, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing a device and a test configuration including a de...
- Patent number 6,895,538
- Issue date May 17, 2005
- Infineon Technologies AG
- Alexander Benedix
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and circuit configuration for controlling a data driver
- Patent number 6,515,514
- Issue date Feb 4, 2003
- Infineon Technologies AG
- Henning Hartmann
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Housing for a semiconductor device and semiconductor device testing...
- Publication number 20060002208
- Publication date Jan 5, 2006
- Infineon Technologies AG
- Henning Hartmann
- G01 - MEASURING TESTING
Information Patent Application
Memory component with asymmetrical contact row
- Publication number 20050201134
- Publication date Sep 15, 2005
- Infineon Technologies AG
- Henning Hartmann
- G11 - INFORMATION STORAGE
Information Patent Application
Method for testing a device and a test configuration including a de...
- Publication number 20040015313
- Publication date Jan 22, 2004
- Alexander Benedix
- G11 - INFORMATION STORAGE
Information Patent Application
Method and circuit configuration for controlling a data driver
- Publication number 20020079924
- Publication date Jun 27, 2002
- Henning Hartmann
- H03 - BASIC ELECTRONIC CIRCUITRY