Henri J. Lezec

Person

Strasbourg, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Graphical automated machine control and metrology
- Patent number 8,095,231
- Issue date Jan 10, 2012
- FEI Company
- David J. Tasker
- G05 - CONTROLLING REGULATING
Information Patent Grant
Graphical automated machine control and metrology
- Patent number 7,664,566
- Issue date Feb 16, 2010
- FEI Company
- David J. Tasker
- G01 - MEASURING TESTING
Information Patent Grant
Graphical automated machine control and metrology
- Patent number 7,308,334
- Issue date Dec 11, 2007
- FEI Company
- David J. Tasker
- G01 - MEASURING TESTING
Information Patent Grant
Optical transmission apparatus with directionality and divergence c...
- Patent number 7,057,151
- Issue date Jun 6, 2006
- Université Louis Pasteur
- Henri Joseph Lezec
- G01 - MEASURING TESTING
Information Patent Grant
Proximity deposition
- Patent number 6,926,935
- Issue date Aug 9, 2005
- FEI Company
- Jason Harrison Arjavac
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Graphical automated machine control and metrology
- Patent number 6,889,113
- Issue date May 3, 2005
- FEI Company
- David J. Tasker
- G01 - MEASURING TESTING
Information Patent Grant
Surface plasmon-enhanced read/write heads for optical data storage...
- Patent number 6,834,027
- Issue date Dec 21, 2004
- NEC Laboratories America, Inc.
- Mitsuhito Sakaguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for scanned instrument calibration
- Patent number 6,770,867
- Issue date Aug 3, 2004
- FEI Company
- Henri J. Lezec
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced optical transmission apparatus with improved aperture geom...
- Patent number 6,649,901
- Issue date Nov 18, 2003
- NEC Laboratories America, Inc.
- Tineke Thio
- G11 - INFORMATION STORAGE
Information Patent Grant
Enhanced optical transmission apparatus with improved inter-surface...
- Patent number 6,285,020
- Issue date Sep 4, 2001
- NEC Research Institute, Inc.
- Tae Jin Kim
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Enhanced optical transmission apparatus utilizing metal films havin...
- Patent number 6,236,033
- Issue date May 22, 2001
- NEC Research Institute, Inc.
- Thomas W. Ebbesen
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
GRAPHICAL AUTOMATED MACHINE CONTROL AND METROLOGY
- Publication number 20100138028
- Publication date Jun 3, 2010
- FEI Company
- DAVID J. TASKER
- G05 - CONTROLLING REGULATING
Information Patent Application
GRAPHICAL AUTOMATED MACHINE CONTROL AND METROLOGY
- Publication number 20080097621
- Publication date Apr 24, 2008
- FEI Company
- DAVID J. TASKER
- G05 - CONTROLLING REGULATING
Information Patent Application
Graphical automated machine control and metrology
- Publication number 20050188309
- Publication date Aug 25, 2005
- FEI Company
- David J. Tasker
- G05 - CONTROLLING REGULATING
Information Patent Application
Proximity deposition
- Publication number 20040261719
- Publication date Dec 30, 2004
- Jason Harrison Arjavac
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Optical transmission apparatus with directionality and divergence c...
- Publication number 20040190116
- Publication date Sep 30, 2004
- Henri Joseph Lezec
- G02 - OPTICS
Information Patent Application
ENHANCED OPTICAL TRANSMISSION APPARATUS WITH IMPORVED APERTURE GEOM...
- Publication number 20030173501
- Publication date Sep 18, 2003
- NEC Research Institute, Inc.
- Tineke Thio
- G02 - OPTICS
Information Patent Application
Method and apparatus for scanned instrument calibration
- Publication number 20030085352
- Publication date May 8, 2003
- Henri J. Lezec
- G01 - MEASURING TESTING
Information Patent Application
Graphical automated machine control and metrology
- Publication number 20030067496
- Publication date Apr 10, 2003
- David J. Tasker
- G01 - MEASURING TESTING

Henri J. Lezec

Person

Patents Grantslast 30 patents

Graphical automated machine control and metrology

Graphical automated machine control and metrology

Graphical automated machine control and metrology

Optical transmission apparatus with directionality and divergence c...

Proximity deposition

Graphical automated machine control and metrology

Surface plasmon-enhanced read/write heads for optical data storage...

Method and apparatus for scanned instrument calibration

Enhanced optical transmission apparatus with improved aperture geom...

Enhanced optical transmission apparatus with improved inter-surface...

Enhanced optical transmission apparatus utilizing metal films havin...

Patents Applicationslast 30 patents

GRAPHICAL AUTOMATED MACHINE CONTROL AND METROLOGY

GRAPHICAL AUTOMATED MACHINE CONTROL AND METROLOGY

Graphical automated machine control and metrology

Proximity deposition

Optical transmission apparatus with directionality and divergence c...

ENHANCED OPTICAL TRANSMISSION APPARATUS WITH IMPORVED APERTURE GEOM...

Method and apparatus for scanned instrument calibration

Graphical automated machine control and metrology