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Henriette Muller
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Aalen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Interferometer system and method for recording an interferogram usi...
Patent number
7,002,694
Issue date
Feb 21, 2006
Carl Zeiss SMT AG
Stefan Schulte
G01 - MEASURING TESTING
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Patent Grant
Projection exposure system having a reflective reticle
Patent number
6,590,718
Issue date
Jul 8, 2003
Carl-Zeiss-Stiftung
Gerd Fürter
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
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Patent Application
Interferometer system, method for recording an interferogram and me...
Publication number
20040190002
Publication date
Sep 30, 2004
Carl Zeiss SMT AG
Stefan Schulte
G01 - MEASURING TESTING
Information
Patent Application
Projection exposure system having a reflective reticle
Publication number
20010022691
Publication date
Sep 20, 2001
Gerd Furter
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY