Henrik Asendorf

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Hamburg, DE

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Patents Grantslast 30 patents

Information Patent Grant
Test apparatus and method for testing a semiconductor device
- Patent number 11,635,461
- Issue date Apr 25, 2023
- NXP B.V.
- Abdellatif Zanati
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus comprising a semiconductor device and test app...
- Patent number 11,415,626
- Issue date Aug 16, 2022
- NXP B.V.
- Jan-Peter Schat
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MASS-PRODUCTION TESTING FOR LAUNCHER-IN-PACKAGE WITH THROUGH-BOARD...
- Publication number 20240402244
- Publication date Dec 5, 2024
- NXP B.V.
- Giorgio Carluccio
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS COMPRISING A SEMICONDUCTOR DEVICE AND TEST APP...
- Publication number 20210239754
- Publication date Aug 5, 2021
- NXP B.V.
- Jan-Peter Schat
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND METHOD FOR TESTING A SEMICONDUCTOR DEVICE
- Publication number 20210239753
- Publication date Aug 5, 2021
- NXP B.V.
- Abdellatif Zanati
- G01 - MEASURING TESTING