Henrik Nielsen

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Mounting configurations for optoelectronic components in LiDAR systems
- Patent number 11,686,818
- Issue date Jun 27, 2023
- CEPTON TECHNOLOGIES, INC.
- Mark Armstrong McCord
- G02 - OPTICS
Information Patent Grant
Integrated multi-channel analog front end and digitizer for high sp...
- Patent number 9,462,206
- Issue date Oct 4, 2016
- KLA-Tencor Coporation
- David L. Brown
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image synchronization of scanning wafer inspection system
- Patent number 9,208,553
- Issue date Dec 8, 2015
- KLA-Tencor Corporation
- Kai Cao
- G01 - MEASURING TESTING
Information Patent Grant
Image synchronization of scanning wafer inspection system
- Patent number 8,995,746
- Issue date Mar 31, 2015
- KLA-Tencor Corporation
- Kai Cao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated multi-channel analog front end and digitizer for high sp...
- Patent number 8,754,972
- Issue date Jun 17, 2014
- KLA-Tencor Corporation
- David L. Brown
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Detection system for nanometer scale topographic measurements of re...
- Patent number 8,384,903
- Issue date Feb 26, 2013
- KLA-Tencor Corporation
- Henrik K. Nielsen
- G01 - MEASURING TESTING
Information Patent Grant
High density in-package microelectronic amplifier
- Patent number 7,626,827
- Issue date Dec 1, 2009
- KLA-Tencor Corporation
- Henrik K. Nielsen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Detection system for nanometer scale topographic measurements of re...
- Patent number 7,342,672
- Issue date Mar 11, 2008
- KLA-Tencor Corporation
- Henrik K. Nielsen
- G01 - MEASURING TESTING
Information Patent Grant
Detection system for nanometer scale topographic measurements of re...
- Patent number 6,999,183
- Issue date Feb 14, 2006
- KLA-Tencor Corporation
- Henrik K. Nielsen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MOUNTING CONFIGURATIONS FOR OPTOELECTRONIC COMPONENTS IN LIDAR SYSTEMS
- Publication number 20200309910
- Publication date Oct 1, 2020
- Cepton Technologies, Inc.
- Mark Armstrong McCord
- G01 - MEASURING TESTING
Information Patent Application
IMAGE SYNCHRONIZATION OF SCANNING WAFER INSPECTION SYSTEM
- Publication number 20150170357
- Publication date Jun 18, 2015
- KLA-Tencor Corporation
- Kai Cao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE SYNCHRONIZATION OF SCANNING WAFER INSPECTION SYSTEM
- Publication number 20140270471
- Publication date Sep 18, 2014
- KLA-Tencor Corporation
- Kai Cao
- G01 - MEASURING TESTING
Information Patent Application
Integrated Multi-Channel Analog Front End And Digitizer For High Sp...
- Publication number 20140240562
- Publication date Aug 28, 2014
- KLA-Tencor Corporation
- David L. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Multi-Channel Analog Front End And Digitizer For High Sp...
- Publication number 20130194445
- Publication date Aug 1, 2013
- KLA-Tencor Corporation
- David L. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High Density In-Package Microelectronic Amplifier
- Publication number 20090067137
- Publication date Mar 12, 2009
- KLA-Tencor Corporation
- Henrik K. Nielsen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Detection system for nanometer scale topographic measurements of re...
- Publication number 20080225275
- Publication date Sep 18, 2008
- KLA-Tencor Corporation
- HENRIK K. NIELSEN
- G01 - MEASURING TESTING
Information Patent Application
Detection system for nanometer scale topographic measurements of re...
- Publication number 20060092427
- Publication date May 4, 2006
- Henrik K. Nielsen
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM FOR NANOMETER SCALE TOPOGRAPHIC MEASUREMENTS OF RE...
- Publication number 20010013936
- Publication date Aug 16, 2001
- KLA-Tencor Corporation
- HENRIK K. NIELSEN
- G01 - MEASURING TESTING

Henrik Nielsen

Person

Patents Grantslast 30 patents

Mounting configurations for optoelectronic components in LiDAR systems

Integrated multi-channel analog front end and digitizer for high sp...

Image synchronization of scanning wafer inspection system

Image synchronization of scanning wafer inspection system

Integrated multi-channel analog front end and digitizer for high sp...

Detection system for nanometer scale topographic measurements of re...

High density in-package microelectronic amplifier

Detection system for nanometer scale topographic measurements of re...

Detection system for nanometer scale topographic measurements of re...

Patents Applicationslast 30 patents

MOUNTING CONFIGURATIONS FOR OPTOELECTRONIC COMPONENTS IN LIDAR SYSTEMS

IMAGE SYNCHRONIZATION OF SCANNING WAFER INSPECTION SYSTEM

IMAGE SYNCHRONIZATION OF SCANNING WAFER INSPECTION SYSTEM

Integrated Multi-Channel Analog Front End And Digitizer For High Sp...

Integrated Multi-Channel Analog Front End And Digitizer For High Sp...

High Density In-Package Microelectronic Amplifier

Detection system for nanometer scale topographic measurements of re...

Detection system for nanometer scale topographic measurements of re...

DETECTION SYSTEM FOR NANOMETER SCALE TOPOGRAPHIC MEASUREMENTS OF RE...