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Henry A. Hill
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Tucson, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Trigger-actuated grease applicator
Patent number
11,473,723
Issue date
Oct 18, 2022
Dualco, Inc.
D. L. Whitney Reed
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Alignment metrology and resolution measurement system for imaging a...
Patent number
8,675,077
Issue date
Mar 18, 2014
FLIR Systems, Inc.
Henry A. Hill
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Multiple-degree of freedom interferometer with compensation for gas...
Patent number
7,894,075
Issue date
Feb 22, 2011
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Compensation of effects of atmospheric perturbations in optical met...
Patent number
7,826,063
Issue date
Nov 2, 2010
Zygo Corporation
Henry A. Hill
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Distance measuring interferometer and encoder metrology systems for...
Patent number
7,812,964
Issue date
Oct 12, 2010
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Multiple-degree of freedom interferometer with compensation for gas...
Patent number
7,812,965
Issue date
Oct 12, 2010
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for reducing wavefront errors in output beams of acousto-...
Patent number
7,697,195
Issue date
Apr 13, 2010
Zygo Corporation
Henry A. Hill
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Apparatus and method for in situ and ex situ measurement of spatial...
Patent number
7,646,490
Issue date
Jan 12, 2010
Zetetic Institute
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Cyclic error compensation in interferometry systems
Patent number
7,616,322
Issue date
Nov 10, 2009
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Multi-axis interferometers and methods and systems using multi-axis...
Patent number
7,548,322
Issue date
Jun 16, 2009
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Angle interferometers
Patent number
7,532,330
Issue date
May 12, 2009
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Compensation of turbulent effects of gas in measurement paths of mu...
Patent number
7,528,961
Issue date
May 5, 2009
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for reducing non-cyclic non-linear errors in...
Patent number
7,528,962
Issue date
May 5, 2009
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method of in situ and ex situ measurement of spatial...
Patent number
7,508,527
Issue date
Mar 24, 2009
Zetetic Institute
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for joint measurements of conjugated quadratur...
Patent number
7,495,769
Issue date
Feb 24, 2009
Zetetic Institute
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Beam shear reduction in interferometry systems
Patent number
7,495,770
Issue date
Feb 24, 2009
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Error correction in interferometry systems
Patent number
7,489,407
Issue date
Feb 10, 2009
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measurement and compensation of atmospheri...
Patent number
7,460,245
Issue date
Dec 2, 2008
Zetetic Institute
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Multi-axis interferometer with procedure and data processing for mi...
Patent number
7,433,049
Issue date
Oct 7, 2008
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for in situ and ex situ measurements of optica...
Patent number
7,428,058
Issue date
Sep 23, 2008
Zetetic Institute
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Cyclic error compensation in interferometry systems
Patent number
7,428,685
Issue date
Sep 23, 2008
Zygo Corporation
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for reduction and compensation of effects of...
Patent number
7,405,832
Issue date
Jul 29, 2008
Zetetic Institute
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Coating for reflective optical components
Patent number
7,382,466
Issue date
Jun 3, 2008
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Stage alignment in lithography tools
Patent number
7,379,190
Issue date
May 27, 2008
Zygo Corporation
Henry A. Hill
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Interferometry systems and methods of using interferometry systems
Patent number
7,375,823
Issue date
May 20, 2008
Zygo Corporation
Gary Womack
G01 - MEASURING TESTING
Information
Patent Grant
Catoptric and catadioptric imaging systems with adaptive catoptric...
Patent number
7,355,722
Issue date
Apr 8, 2008
Zetetic Institute
Henry Allen Hill
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measurement of critical dimensions of feat...
Patent number
7,345,771
Issue date
Mar 18, 2008
Zetetic Institute
Henry Allen Hill
G01 - MEASURING TESTING
Information
Patent Grant
Compensation for geometric effects of beam misalignments in plane m...
Patent number
7,330,274
Issue date
Feb 12, 2008
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Compensation for effects of beam misalignments in interferometer me...
Patent number
7,327,465
Issue date
Feb 5, 2008
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for ellipsometric measurements with high spati...
Patent number
7,324,209
Issue date
Jan 29, 2008
Zetetic Institute
Henry Allen Hill
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TRIGGER-ACTUATED GREASE APPLICATOR
Publication number
20200088348
Publication date
Mar 19, 2020
DUALCO, Inc.
D.L. Whitney REED
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Application
ALIGNMENT METROLOGY AND RESOLUTION MEASUREMENT SYSTEM FOR IMAGING A...
Publication number
20100020180
Publication date
Jan 28, 2010
Salvador Imaging, Inc.(a Delaware Corporation)
Henry A. Hill
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Apparatus and Method For Nanoradian Metrology of Changes In Angular...
Publication number
20080285106
Publication date
Nov 20, 2008
Nikon Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Multiple-degree of freedom interferometer with compensation for gas...
Publication number
20080285051
Publication date
Nov 20, 2008
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR JOINT MEASUREMENTS OF CONJUGATED QUADRATUR...
Publication number
20080180682
Publication date
Jul 31, 2008
Zetetic Institute
Henry Allen HILL
A45 - HAND OR TRAVELLING ARTICLES
Information
Patent Application
Distance Measuring Interferometer and Encoder Metrology Systems for...
Publication number
20080165345
Publication date
Jul 10, 2008
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Multiple-degree of freedom interferometer with compensation for gas...
Publication number
20080151229
Publication date
Jun 26, 2008
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Multi-Axis Interferometers and Methods and Systems Using Multi-Axis...
Publication number
20080117428
Publication date
May 22, 2008
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
COMPENSATION OF EFFECTS OF ATMOSPHERIC PERTURBATIONS IN OPTICAL MET...
Publication number
20080062405
Publication date
Mar 13, 2008
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for in situ and ex situ measurement of spatial...
Publication number
20080030742
Publication date
Feb 7, 2008
Zetetic Institute
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR REDUCING WAVEFRONT ERRORS IN OUTPUT BEAMS OF ACOUSTO-...
Publication number
20070279637
Publication date
Dec 6, 2007
Henry A. Hill
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Apparatus and method for reducing effects of coherent artifacts and...
Publication number
20070121115
Publication date
May 31, 2007
Zetetic Institute
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Angle interferometers
Publication number
20070064240
Publication date
Mar 22, 2007
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Methods for Reduction and Compensation of Effects of...
Publication number
20070058174
Publication date
Mar 15, 2007
Zetetic Institute
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Method for Measurement and Compensation of Atmospheri...
Publication number
20070046951
Publication date
Mar 1, 2007
Zetetic Institute
Henry A. Hill
G02 - OPTICS
Information
Patent Application
Beam shear reduction in interferometry systems
Publication number
20070035742
Publication date
Feb 15, 2007
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Continuously Tunable External Cavity Diode Laser Sources With High...
Publication number
20070014319
Publication date
Jan 18, 2007
Zetetic Institute
Henry A. Hill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Cyclic Error Compensation in Interferometry Systems
Publication number
20070008547
Publication date
Jan 11, 2007
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and methods for reducing non-cyclic non-linear errors in...
Publication number
20070002330
Publication date
Jan 4, 2007
Zygo Corporation
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for in situ and ex situ measurements of optica...
Publication number
20060285124
Publication date
Dec 21, 2006
Zetetic Institute
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Compensation of turbulent effects of gas in measurement paths of mu...
Publication number
20060256346
Publication date
Nov 16, 2006
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method of in situ and ex situ measurement of spatial...
Publication number
20060250620
Publication date
Nov 9, 2006
Zetetic Institute
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Multi-axis interferometer with procedure and data processing for mi...
Publication number
20060215173
Publication date
Sep 28, 2006
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Interferometry systems and methods of using interferometry systems
Publication number
20060187464
Publication date
Aug 24, 2006
Gary Womack
G01 - MEASURING TESTING
Information
Patent Application
CATOPTRIC AND CATADIOPTRIC IMAGING SYSTEMS WITH PELLICLE AND APERTU...
Publication number
20060092429
Publication date
May 4, 2006
Zetetic Institute
Henry A. Hill
G02 - OPTICS
Information
Patent Application
Error correction in interferometry systems
Publication number
20060072119
Publication date
Apr 6, 2006
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Catoptric and catadioptric imaging systems with pellicle and apertu...
Publication number
20060072204
Publication date
Apr 6, 2006
Zetetic Institute
Henry A. Hill
G02 - OPTICS
Information
Patent Application
Catoptric imaging systems comprising pellicle and/or aperture-array...
Publication number
20060066873
Publication date
Mar 30, 2006
Zetetic Institute
Henry Allen Hill
G01 - MEASURING TESTING
Information
Patent Application
Compensation for effects of beam misalignments in interferometer me...
Publication number
20060061771
Publication date
Mar 23, 2006
Henry A. Hill
G01 - MEASURING TESTING
Information
Patent Application
Sub-nanometer overlay, critical dimension, and lithography tool pro...
Publication number
20060050283
Publication date
Mar 9, 2006
Zetetic Institute
Henry Allen Hill
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY