Henry Buijs

Person

Sillery, CA

People

Patents Grantslast 30 patents

Information Patent Grant
Dissolved gas analysis devices, systems, and methods
- Patent number 11,860,148
- Issue date Jan 2, 2024
- ABB Schweiz AG
- Henry L. Buijs
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Dissolved gas analysis devices, systems, and methods
- Patent number 11,796,455
- Issue date Oct 24, 2023
- ABB Schweiz AG
- Henry L. Buijs
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Dissolved gas analysis devices, systems, and methods
- Patent number 10,832,854
- Issue date Nov 10, 2020
- ABB Schweiz AG
- Henry L. Buijs
- G01 - MEASURING TESTING
Information Patent Grant
Dissolved gas analysis devices, systems, and methods
- Patent number 10,585,036
- Issue date Mar 10, 2020
- ABB Schweiz AG
- Henry L. Buijs
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Dissolved gas analysis devices, systems, and methods
- Patent number 10,586,649
- Issue date Mar 10, 2020
- ABB Schweiz AG
- Henry L. Buijs
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of hydrocarbon contamination in water
- Patent number 10,101,271
- Issue date Oct 16, 2018
- ABB Schweiz AG
- Henry L. Buijs
- G01 - MEASURING TESTING
Information Patent Grant
Beamsplitter configuration for optical subtraction of self emission...
- Patent number 9,146,158
- Issue date Sep 29, 2015
- ABB Inc.
- Henry L. Buijs
- G01 - MEASURING TESTING
Information Patent Grant
Stiffness compensation in opto-mechanical mechanisms
- Patent number 8,542,423
- Issue date Sep 24, 2013
- ABB Inc.
- Mathieu J. Demers
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Spectral estimation of spectrometers time-sampled signals using fas...
- Patent number 8,014,965
- Issue date Sep 6, 2011
- ABB Bomen
- Raphaël Desbiens
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for the improved measurement of circular and...
- Patent number 7,522,283
- Issue date Apr 21, 2009
- BioTools, Inc.
- Laurence A. Nafie
- G01 - MEASURING TESTING
Information Patent Grant
Two-beam interferometer for fourier transform spectroscopy with dou...
- Patent number 7,480,055
- Issue date Jan 20, 2009
- ABB Bomem Inc.
- Henry L. Buijs
- G01 - MEASURING TESTING
Information Patent Grant
On-line optical analysis of a substance through a conduit section o...
- Patent number 7,460,232
- Issue date Dec 2, 2008
- ABB Bomem Inc.
- Henry Buijs
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for spectrometer alignment
- Patent number 4,345,838
- Issue date Aug 24, 1982
- Henry L. Buijs
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
DISSOLVED GAS ANALYSIS DEVICES, SYSTEMS, AND METHODS
- Publication number 20210020355
- Publication date Jan 21, 2021
- ABB Schweiz AG
- Henry L. Buijs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISSOLVED GAS ANALYSIS DEVICES, SYSTEMS, AND METHODS
- Publication number 20200211761
- Publication date Jul 2, 2020
- ABB Schweiz AG
- Henry L. Buijs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISSOLVED GAS ANALYSIS DEVICES, SYSTEMS, AND METHODS
- Publication number 20200209152
- Publication date Jul 2, 2020
- ABB Schweiz AG
- Henry L. Buijs
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
DISSOLVED GAS ANALYSIS DEVICES, SYSTEMS, AND METHODS
- Publication number 20180259444
- Publication date Sep 13, 2018
- ABB Schweiz AG
- Henry L. Buijs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISSOLVED GAS ANALYSIS DEVICES, SYSTEMS, AND METHODS
- Publication number 20180259451
- Publication date Sep 13, 2018
- ABB Schweiz AG
- Henry L. Buijs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT OF HYDROCARBON CONTAMINATION IN WATER
- Publication number 20180172586
- Publication date Jun 21, 2018
- Henry L. Buijs
- G01 - MEASURING TESTING
Information Patent Application
Beamsplitter Configuration For Optical Subtraction of Self Emission...
- Publication number 20120194822
- Publication date Aug 2, 2012
- ABB BOMEM INC.
- Henry L. Buijs
- G02 - OPTICS
Information Patent Application
STIFFNESS COMPENSATION IN OPTO-MECHANICAL MECHANISMS
- Publication number 20110038021
- Publication date Feb 17, 2011
- Mathieu J. Demers
- G02 - OPTICS
Information Patent Application
Spectral estimation of spectrometers time-sampled signals using fas...
- Publication number 20080198374
- Publication date Aug 21, 2008
- ABB Bomem Inc.
- Raphael Desbiens
- G01 - MEASURING TESTING
Information Patent Application
Two-beam interferometer for fourier transform spectroscopy with dou...
- Publication number 20080170232
- Publication date Jul 17, 2008
- Henry L. Buijs
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for the improved measurment of circular and l...
- Publication number 20060139650
- Publication date Jun 29, 2006
- Bio Tools, Inc.
- Laurence A. Nafie
- G01 - MEASURING TESTING
Information Patent Application
On-line optical analysis of a substance through a conduit section o...
- Publication number 20040233453
- Publication date Nov 25, 2004
- ABB Bomem
- Henry Buijs
- G01 - MEASURING TESTING

Henry Buijs

Person

Patents Grantslast 30 patents

Dissolved gas analysis devices, systems, and methods

Dissolved gas analysis devices, systems, and methods

Dissolved gas analysis devices, systems, and methods

Dissolved gas analysis devices, systems, and methods

Dissolved gas analysis devices, systems, and methods

Measurement of hydrocarbon contamination in water

Beamsplitter configuration for optical subtraction of self emission...

Stiffness compensation in opto-mechanical mechanisms

Spectral estimation of spectrometers time-sampled signals using fas...

Methods and apparatus for the improved measurement of circular and...

Two-beam interferometer for fourier transform spectroscopy with dou...

On-line optical analysis of a substance through a conduit section o...

Apparatus for spectrometer alignment

Patents Applicationslast 30 patents

DISSOLVED GAS ANALYSIS DEVICES, SYSTEMS, AND METHODS

DISSOLVED GAS ANALYSIS DEVICES, SYSTEMS, AND METHODS

DISSOLVED GAS ANALYSIS DEVICES, SYSTEMS, AND METHODS

DISSOLVED GAS ANALYSIS DEVICES, SYSTEMS, AND METHODS

DISSOLVED GAS ANALYSIS DEVICES, SYSTEMS, AND METHODS

MEASUREMENT OF HYDROCARBON CONTAMINATION IN WATER

Beamsplitter Configuration For Optical Subtraction of Self Emission...

STIFFNESS COMPENSATION IN OPTO-MECHANICAL MECHANISMS

Spectral estimation of spectrometers time-sampled signals using fas...

Two-beam interferometer for fourier transform spectroscopy with dou...

Methods and apparatus for the improved measurment of circular and l...

On-line optical analysis of a substance through a conduit section o...