Henry C. Abbink

Person

Westlake Village, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Accelerometer sensor system
- Patent number 10,330,696
- Issue date Jun 25, 2019
- Northrop Grumman Systems Corporation
- Michael D. Bulatowicz
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Nuclear magnetic resonance probe system
- Patent number 9,970,999
- Issue date May 15, 2018
- Northrop Grumman Systems Corporation
- Michael S. Larsen
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining leak rate through a bond line of a MEMS device
- Patent number 8,579,502
- Issue date Nov 12, 2013
- Northrop Grumman Corporation
- Henry C. Abbink
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Systems and methods for obstructing magnetic flux while shielding a...
- Patent number 8,552,725
- Issue date Oct 8, 2013
- Northrop Grumman Guidance and Electronics Company, Inc.
- Henry C. Abbink
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Middle layer of die structure that comprises a cavity that holds an...
- Patent number 8,530,249
- Issue date Sep 10, 2013
- Northrop Grumman Systems Corporation
- Henry C. Abbink
- G04 - HOROLOGY
Information Patent Grant
Method for optimizing direct wafer bond line width for reduction of...
- Patent number 8,007,166
- Issue date Aug 30, 2011
- Northrop Grumman Systems Corporation
- Henry C. Abbink
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Middle layer of die structure that comprises a cavity that holds an...
- Patent number 7,973,611
- Issue date Jul 5, 2011
- Northrop Grumman Guidance and Electronics Company, Inc.
- Henry C. Abbink
- G04 - HOROLOGY
Information Patent Grant
Photo-detector and related methods
- Patent number 7,605,013
- Issue date Oct 20, 2009
- Northrop Grumman Corporation
- Henry C. Abbink
- G01 - MEASURING TESTING
Information Patent Grant
Photo-detector and related instruments
- Patent number 7,382,002
- Issue date Jun 3, 2008
- Litton Systems, Inc.
- Henry C. Abbink
- G01 - MEASURING TESTING
Information Patent Grant
Micro-cell for NMR gyroscope
- Patent number 7,292,031
- Issue date Nov 6, 2007
- Northrop Grumman Corporatin
- Henry C. Abbink
- G01 - MEASURING TESTING
Information Patent Grant
Middle layer of die structure that comprises a cavity that holds an...
- Patent number 7,292,111
- Issue date Nov 6, 2007
- Northrop Grumman Corporation
- Henry C. Abbink
- G04 - HOROLOGY
Information Patent Grant
NMR gyroscope
- Patent number 7,239,135
- Issue date Jul 3, 2007
- Northrop Grumman Corporation
- Henry C. Abbink
- G01 - MEASURING TESTING
Information Patent Grant
Dissipation of a charge buildup on a wafer portion
- Patent number 7,038,293
- Issue date May 2, 2006
- Northrop Grumman Corp.
- Youngmin A. Choi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Silicon gyro with integrated driving and sensing structures
- Patent number 6,374,672
- Issue date Apr 23, 2002
- Litton Systems, Inc.
- Henry C. Abbink
- G01 - MEASURING TESTING
Information Patent Grant
Optical fiber rejacketing method, apparatus and product obtained th...
- Patent number 6,153,258
- Issue date Nov 28, 2000
- Litton Systems, Inc.
- Arnold E. Goldman
- G02 - OPTICS
Information Patent Grant
Laser diode and substrate
- Patent number 6,146,025
- Issue date Nov 14, 2000
- Litton Systems Inc.
- Henry C. Abbink
- G02 - OPTICS
Information Patent Grant
Integrated optics chip with reduced thermal errors due to pyroelect...
- Patent number 6,044,184
- Issue date Mar 28, 2000
- Litton Systems Inc.
- Kenneth W. Shafer
- G02 - OPTICS
Information Patent Grant
System and method for aligning and attaching optical fibers to opti...
- Patent number 5,926,594
- Issue date Jul 20, 1999
- Litton Systems, Inc.
- Ike J. Song
- G02 - OPTICS
Information Patent Grant
Hinge assembly for integrated accelerometer
- Patent number 5,428,996
- Issue date Jul 4, 1995
- Litton Systems, Inc.
- Henry C. Abbink
- G01 - MEASURING TESTING
Information Patent Grant
Integrated accelerometer with coil interface spacer
- Patent number 5,253,524
- Issue date Oct 19, 1993
- Litton Systems, Inc.
- Henry C. Abbink
- G01 - MEASURING TESTING
Information Patent Grant
Integrated accelerometer with single hardstop geometry
- Patent number 5,241,862
- Issue date Sep 7, 1993
- Litton Systems, Inc.
- Henry C. Abbink
- G01 - MEASURING TESTING
Information Patent Grant
Integrated accelerometer with resilient limit stops
- Patent number 5,191,794
- Issue date Mar 9, 1993
- Litton Systems, Inc.
- Henry C. Abbink
- G01 - MEASURING TESTING
Information Patent Grant
Integrated accelerometer assembly
- Patent number 4,987,780
- Issue date Jan 29, 1991
- Litton Systems, Inc.
- Henry C. Abbink
- G01 - MEASURING TESTING
Information Patent Grant
Cathode construction for long life lasers
- Patent number 4,007,431
- Issue date Feb 8, 1976
- Litton Systems, Inc.
- Henry C. Abbink
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ACCELEROMETER SENSOR SYSTEM
- Publication number 20170276698
- Publication date Sep 28, 2017
- Northrop Grumman Systems Corporation
- MICHAEL D. BULATOWICZ
- G01 - MEASURING TESTING
Information Patent Application
NUCLEAR MAGNETIC RESONANCE PROBE SYSTEM
- Publication number 20130328557
- Publication date Dec 12, 2013
- Northrop Grumman Systems Corporation
- MICHAEL S. LARSEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR OBSTRUCTING MAGNETIC FLUX
- Publication number 20130279144
- Publication date Oct 24, 2013
- Northrop Grumman Systems Corporation
- HENRY C. ABBINK
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING LEAK RATE THROUGH A BOND LINE OF A MEMS DEVICE
- Publication number 20110271744
- Publication date Nov 10, 2011
- NORTHROP GRUMMAN SYSTEMS CORPORATION
- Henry C. Abbink
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Middle layer of die structure that comprises a cavity that holds a...
- Publication number 20110219729
- Publication date Sep 15, 2011
- Henry C. Abbink
- G04 - HOROLOGY
Information Patent Application
Systems and Methods for Obstructing Magnetic Flux
- Publication number 20110133738
- Publication date Jun 9, 2011
- Henry C. Abbink
- G01 - MEASURING TESTING
Information Patent Application
Method for Optimizing Direct Wafer Bond Line Width for Reduction of...
- Publication number 20080184778
- Publication date Aug 7, 2008
- Northrop Grumman Corporation
- Henry C. Abbink
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PHOTO-DETECTOR AND RELATED METHODS
- Publication number 20080160668
- Publication date Jul 3, 2008
- Litton Systems, Inc.
- Henry C. Abbink
- G01 - MEASURING TESTING
Information Patent Application
Middle layer of die structure that comprises a cavity that holds an...
- Publication number 20080000606
- Publication date Jan 3, 2008
- Henry C. Abbink
- G04 - HOROLOGY
Information Patent Application
NMR gyroscope
- Publication number 20060139029
- Publication date Jun 29, 2006
- Henry C. Abbink
- G01 - MEASURING TESTING
Information Patent Application
Micro-cell for NMR gyroscope
- Publication number 20060132130
- Publication date Jun 22, 2006
- Henry C. Abbink
- G04 - HOROLOGY
Information Patent Application
Photo-detector and related methods
- Publication number 20060125068
- Publication date Jun 15, 2006
- Henry C. Abbink
- G01 - MEASURING TESTING
Information Patent Application
Middle layer of die structure that comprises a cavity that holds an...
- Publication number 20050236460
- Publication date Oct 27, 2005
- Henry C. Abbink
- G04 - HOROLOGY
Information Patent Application
Dissipation of a charge buildup on a wafer portion
- Publication number 20050212077
- Publication date Sep 29, 2005
- Youngmin A. Choi
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Henry C. Abbink

Person

Patents Grantslast 30 patents

Accelerometer sensor system

Nuclear magnetic resonance probe system

Method for determining leak rate through a bond line of a MEMS device

Systems and methods for obstructing magnetic flux while shielding a...

Middle layer of die structure that comprises a cavity that holds an...

Method for optimizing direct wafer bond line width for reduction of...

Middle layer of die structure that comprises a cavity that holds an...

Photo-detector and related methods

Photo-detector and related instruments

Micro-cell for NMR gyroscope

Middle layer of die structure that comprises a cavity that holds an...

NMR gyroscope

Dissipation of a charge buildup on a wafer portion

Silicon gyro with integrated driving and sensing structures

Optical fiber rejacketing method, apparatus and product obtained th...

Laser diode and substrate

Integrated optics chip with reduced thermal errors due to pyroelect...

System and method for aligning and attaching optical fibers to opti...

Hinge assembly for integrated accelerometer

Integrated accelerometer with coil interface spacer

Integrated accelerometer with single hardstop geometry

Integrated accelerometer with resilient limit stops

Integrated accelerometer assembly

Cathode construction for long life lasers

Patents Applicationslast 30 patents

ACCELEROMETER SENSOR SYSTEM

NUCLEAR MAGNETIC RESONANCE PROBE SYSTEM

SYSTEMS AND METHODS FOR OBSTRUCTING MAGNETIC FLUX

METHOD FOR DETERMINING LEAK RATE THROUGH A BOND LINE OF A MEMS DEVICE

Middle layer of die structure that comprises a cavity that holds a...

Systems and Methods for Obstructing Magnetic Flux

Method for Optimizing Direct Wafer Bond Line Width for Reduction of...

PHOTO-DETECTOR AND RELATED METHODS

Middle layer of die structure that comprises a cavity that holds an...

NMR gyroscope

Micro-cell for NMR gyroscope

Photo-detector and related methods

Middle layer of die structure that comprises a cavity that holds an...

Dissipation of a charge buildup on a wafer portion