Henry Mittel

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Santa Barbara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus of electrical property measurement using an AF...
- Patent number 9,869,694
- Issue date Jan 16, 2018
- Bruker Nano, Inc.
- Chunzeng Li
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of electrical property measurement using an AF...
- Patent number 9,213,047
- Issue date Dec 15, 2015
- Bruker Nano, Inc.
- Chunzeng Li
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Low drift scanning probe microscope
- Patent number 9,116,168
- Issue date Aug 25, 2015
- Bruker Nano, Inc.
- Anthonius G. Ruiter
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Low drift scanning probe microscope
- Patent number 8,869,310
- Issue date Oct 21, 2014
- Bruker Nano, Inc.
- Anthonius Ruiter
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method of amplifying low voltage signals
- Patent number 7,886,583
- Issue date Feb 15, 2011
- Veeco Instruments Inc.
- Carl Masser
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Nano-Mechanical Infrared Spectroscopy System and Method Using Gated...
- Publication number 20240168053
- Publication date May 23, 2024
- Bruker Nano, Inc.
- Martin Wagner
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Electrical Property Measurement Using an AF...
- Publication number 20160178659
- Publication date Jun 23, 2016
- Bruker Nano, Inc.
- Chunzeng Li
- G01 - MEASURING TESTING
Information Patent Application
Low Drift Scanning Probe Microscope
- Publication number 20150074859
- Publication date Mar 12, 2015
- Bruker Nano, Inc.
- Anthonius G. Ruiter
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Electrical Property Measurement Using an AF...
- Publication number 20130276174
- Publication date Oct 17, 2013
- Chunzeng Li
- B82 - NANO-TECHNOLOGY
Information Patent Application
Low Drift Scanning Probe Microscope
- Publication number 20110239336
- Publication date Sep 29, 2011
- BRUCKER NANO, INC.
- Anthonius Ruiter
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD OF AMPLIFYING LOW VOLTAGE SIGNALS
- Publication number 20080011064
- Publication date Jan 17, 2008
- Carl Masser
- G01 - MEASURING TESTING